{"title":"Atomic force microscopy in the characterization and clinical evaluation of neurological disorders: current and emerging technologies","authors":"David T. She, M. Nai, C. T. Lim","doi":"10.1007/s44258-024-00022-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":74169,"journal":{"name":"Med-X","volume":"113 11","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Med-X","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s44258-024-00022-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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