{"title":"Dion-Jacobson 2D Perovskite 2AMPPbBr4 with Type II Band Alignment for Highly Sensitive X-Ray Detection","authors":"Zhihang Zhang, Bo Jiao, Fang Pan, Jianing Wang, Jingrui Li, Zezhou Liang, Haomiao Li, Lihe Yan, Dongdong Wang, Guijiang Zhou, Xun Hou, Zhaoxin Wu","doi":"10.1002/admt.202400102","DOIUrl":null,"url":null,"abstract":"<p>2D hybrid perovskites have emerged as a promising alternative material to address the environmental stability and the ion-migration of the 3D perovskites for direct X-ray detector applications. Nevertheless, the X-ray detection performance of the 2D hybrid perovskites still lags because of its low X-ray attenuation ability and limited solubility for thick film deposition. Here, a high-performance X-ray detector in Dion-Jacobson 2D hybrid perovskite, 2(aminomethyl) pyridinium lead bromide (2AMPPbBr<sub>4</sub>), is studied. 2AMPPbBr<sub>4</sub> exhibits an ultra-short interlayer distance of 3.43 Å, leading to high X-ray attenuation ability. Furthermore, DFT results indicate that 2AMPPbBr<sub>4</sub> exhibits type II band alignment between 2AMP<sup>2+</sup> ligand and the [PbI<sub>6</sub>]<sup>4−</sup> layers, facilitating effective spatial separation of photo-generated carriers. The X-ray detector made of 2AMPPbBr<sub>4</sub> with an average thickness of 200 µm is realized via an improved drop-casting method. An improved X-ray sensitivity of 3933.88 µC Gy<sup>−1</sup> cm<sup>−2</sup> and a low detection limit of 4.17 nGy s<sup>−1</sup> is achieved. This work paves the way for high-performance X-ray detectors based on the emerging 2D perovskite materials.</p>","PeriodicalId":7292,"journal":{"name":"Advanced Materials Technologies","volume":null,"pages":null},"PeriodicalIF":6.4000,"publicationDate":"2024-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Materials Technologies","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/admt.202400102","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
2D hybrid perovskites have emerged as a promising alternative material to address the environmental stability and the ion-migration of the 3D perovskites for direct X-ray detector applications. Nevertheless, the X-ray detection performance of the 2D hybrid perovskites still lags because of its low X-ray attenuation ability and limited solubility for thick film deposition. Here, a high-performance X-ray detector in Dion-Jacobson 2D hybrid perovskite, 2(aminomethyl) pyridinium lead bromide (2AMPPbBr4), is studied. 2AMPPbBr4 exhibits an ultra-short interlayer distance of 3.43 Å, leading to high X-ray attenuation ability. Furthermore, DFT results indicate that 2AMPPbBr4 exhibits type II band alignment between 2AMP2+ ligand and the [PbI6]4− layers, facilitating effective spatial separation of photo-generated carriers. The X-ray detector made of 2AMPPbBr4 with an average thickness of 200 µm is realized via an improved drop-casting method. An improved X-ray sensitivity of 3933.88 µC Gy−1 cm−2 and a low detection limit of 4.17 nGy s−1 is achieved. This work paves the way for high-performance X-ray detectors based on the emerging 2D perovskite materials.
用于高灵敏 X 射线探测的具有 II 型带排列的 Dion-Jacobson 2D Perovskite 2AMPPbBr4
二维混合包晶已成为一种很有前途的替代材料,可解决三维包晶的环境稳定性和离子迁移问题,直接应用于 X 射线探测器。然而,由于二维混合包晶的 X 射线衰减能力较低,且厚膜沉积的溶解度有限,因此其 X 射线探测性能仍然落后。本文研究了迪昂-雅各布森二维混合包晶 2(氨基甲基)吡啶鎓溴化铅(2AMPPbBr4)的高性能 X 射线探测器。2AMPPbBr4 具有 3.43 Å 的超短层间距离,因而具有很高的 X 射线衰减能力。此外,DFT 结果表明,2AMPPbBr4 在 2AMP2+ 配体和 [PbI6]4- 层之间呈现出 II 型带排列,有利于光生载流子的有效空间分离。平均厚度为 200 µm 的 2AMPPbBr4 X 射线探测器是通过改进的滴铸方法制成的。该探测器的 X 射线灵敏度提高到 3933.88 µC Gy-1 cm-2,探测极限降低到 4.17 nGy s-1。这项工作为基于新兴二维包晶材料的高性能 X 射线探测器铺平了道路。
期刊介绍:
Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.