Multifitting 2: software for reflectometric, off-specular and grazing-incidence small-angle scattering analysis of multilayer nanofilms

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Mikhail Svechnikov
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引用次数: 0

Abstract

Multifitting is a computer program that was originally designed to model the reflection and transmission of shortwave radiation by multilayer nanofilms. Three years have passed since the introduction of this software, and in this paper the focus is on describing the possibilities of Multifitting with regard to off-specular diffuse scattering and grazing-incidence small-angle scattering. The approach to the user interface and to working with the structure model remains the same, and the emphasis is on the ergonomics, calculation speed and intensive use of the program for technological and research tasks. However, the scope of the program has been expanded to make it more useful to existing users, and it may also be of interest to a wider audience.

Abstract Image

Multifitting 2:多层纳米薄膜的反射、非镜面和掠入射小角散射分析软件
Multifitting 是一种计算机程序,最初设计用于模拟多层纳米薄膜对短波辐射的反射和透射。该软件问世至今已有三年,本文主要介绍 Multifitting 在非镜向漫散射和掠入射小角散射方面的应用。用户界面和结构模型的使用方法保持不变,重点在于程序的人机工程学、计算速度和技术与研究任务的密集使用。不过,程序的范围有所扩大,对现有用户更加有用,也可能会引起更多用户的兴趣。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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