Carina T. Gerritzen, Steven Goderis, Hannah F. James, Christophe Snoeck
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引用次数: 0
Abstract
In recent years, the increasing demand for extensive strontium (Sr) datasets across various scientific fields has prompted the development of fast, precise, and reliable protocols. These protocols aim to achieve high sample-throughput without compromising data quality. A novel method termed the zirconium (Zr) doped sample-standard bracketing (SSB) has been recently introduced for isotope measurements using multi-collector inductively coupled plasma mass spectrometry (MC-ICP-MS). This method allows for simultaneous acquisition of 87Sr/86Sr and δ88Sr data without the need for sample spiking. However, the reliability of this method in handling large datasets and ensuring long-term reproducibility requires additional documentation. A comprehensive examination of the reliability of Sr isotope data over two years involves the implementation of systematic tests on reference materials from the National Institute of standards and technology (NIST) with the standard reference material (SRM) numbers: 1400, 1515, 987, 2910b, 1486, as well as a Hawaiian volcano observatory basalt (BHVO-1). The results of this study lead to the definition of a set of quality control parameters. The developed protocol applies various controls to ensure precise matching of Sr and Zr concentrations for both the samples and the bracketing standard (NIST SRM 987), along with the identification of instrumental biases. The outlined quality control ensures the reproducibility of the results (87Sr/86Sr = 0.710247 ± 0.000026, 2SD, n = 557; and δ88Sr = 0.001 ± 0.053 ‰, 2SD, n = 537 for NIST SRM 987), proving invaluable for archaeological, geological, and ecological studies requiring the fast acquisition of extensive datasets (n > 100) to create isotopic baselines.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.