Weighted Linear Loss Large Margin Distribution Machine for Pattern Classification

IF 1.6 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Ling Liu;Maoxiang Chu;Rongfen Gong;Liming Liu;Yonghui Yang
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引用次数: 0

Abstract

Compared with support vector machine, large margin distribution machine (LDM) has better generalization performance. The central idea of LDM is to maximize the margin mean and minimize the margin variance simultaneously. But the computational complexity of LDM is high. In order to reduce the computational complexity of LDM, a weighted linear loss LDM (WLLDM) is proposed. The framework of WLLDM is built based on LDM and the weighted linear loss. The weighted linear loss is adopted instead of the hinge loss in WLLDM. This modification can transform the quadratic programming problem into a simple linear equation, resulting in lower computational complexity. Thus, WLLDM has the potential to deal with large-scale datasets. The WLLDM is similar in principle to the LDM algorithm, which can optimize the margin distribution and achieve better generalization performance. The WLLDM algorithm is compared with other models by conducting experiments on different datasets. The experimental results show that the proposed WLLDM has better generalization performance and faster training speed.
用于模式分类的加权线性损耗大边际分布机
与支持向量机相比,大边际分布机(LDM)具有更好的泛化性能。LDM 的核心思想是同时实现边际均值最大化和边际方差最小化。但 LDM 的计算复杂度较高。为了降低 LDM 的计算复杂度,有人提出了加权线性损失 LDM(WLLDM)。WLLDM 的框架是基于 LDM 和加权线性损耗建立的。WLLDM 采用加权线性损耗代替铰链损耗。这种修改可以将二次方程式编程问题转化为简单的线性方程,从而降低计算复杂度。因此,WLLDM 具有处理大规模数据集的潜力。WLLDM 算法与 LDM 算法原理相似,可以优化边际分布,实现更好的泛化性能。通过在不同数据集上进行实验,将 WLLDM 算法与其他模型进行了比较。实验结果表明,所提出的 WLLDM 具有更好的泛化性能和更快的训练速度。
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来源期刊
Chinese Journal of Electronics
Chinese Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.70
自引率
16.70%
发文量
342
审稿时长
12.0 months
期刊介绍: CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.
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