Current opinion on the prospect of mapping electronic orbitals in the transmission electron microscope: State of the art, challenges and perspectives

IF 1.5 4区 工程技术 Q3 MICROSCOPY
M. Bugnet, S. Löffler, M. Ederer, D. M. Kepaptsoglou, Q. M. Ramasse
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Abstract

The concept of electronic orbitals has enabled the understanding of a wide range of physical and chemical properties of solids through the definition of, for example, chemical bonding between atoms. In the transmission electron microscope, which is one of the most used and powerful analytical tools for high-spatial-resolution analysis of solids, the accessible quantity is the local distribution of electronic states. However, the interpretation of electronic state maps at atomic resolution in terms of electronic orbitals is far from obvious, not always possible, and often remains a major hurdle preventing a better understanding of the properties of the system of interest. In this review, the current state of the art of the experimental aspects for electronic state mapping and its interpretation as electronic orbitals is presented, considering approaches that rely on elastic and inelastic scattering, in real and reciprocal spaces. This work goes beyond resolving spectral variations between adjacent atomic columns, as it aims at providing deeper information about, for example, the spatial or momentum distributions of the states involved. The advantages and disadvantages of existing experimental approaches are discussed, while the challenges to overcome and future perspectives are explored in an effort to establish the current state of knowledge in this field. The aims of this review are also to foster the interest of the scientific community and to trigger a global effort to further enhance the current analytical capabilities of transmission electron microscopy for chemical bonding and electronic structure analysis.

Abstract Image

目前对透射电子显微镜电子轨道绘图前景的看法:技术现状、挑战和前景。
电子轨道的概念通过对原子间化学键等的定义,使人们得以了解固体的各种物理和化学特性。透射电子显微镜是对固体进行高空间分辨率分析的最常用和最强大的分析工具之一,在透射电子显微镜中,可获取的量是电子状态的局部分布。然而,用电子轨道来解释原子分辨率下的电子状态图远非显而易见,也并非总能实现,而且往往仍是妨碍更好地理解相关系统特性的一大障碍。在这篇综述中,将介绍电子状态映射及其作为电子轨道解释的实验方面的当前技术水平,并考虑在实空间和倒易空间中依靠弹性和非弹性散射的方法。这项工作不仅仅是解决相邻原子柱之间的光谱变化问题,因为它旨在提供有关相关状态的空间或动量分布等更深层次的信息。本综述讨论了现有实验方法的优缺点,同时探讨了需要克服的挑战和未来展望,以努力确立该领域的知识现状。这篇综述的目的还在于激发科学界的兴趣,推动全球进一步提高透射电子显微镜在化学键和电子结构分析方面的现有分析能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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