Strain-engineered rippling at the bilayer-MoS2 interface identified by advanced atomic force microscopy

IF 6.5 2区 物理与天体物理 Q1 PHYSICS, MULTIDISCIPLINARY
Haoyu Dong, Songyang Li, Shuo Mi, Jianfeng Guo, Zhaxi Suonan, Hanxiang Wu, Yanyan Geng, Manyu Wang, Huiwen Xu, Li Guan, Fei Pang, Wei Ji, Rui Xu, Zhihai Cheng
{"title":"Strain-engineered rippling at the bilayer-MoS2 interface identified by advanced atomic force microscopy","authors":"Haoyu Dong,&nbsp;Songyang Li,&nbsp;Shuo Mi,&nbsp;Jianfeng Guo,&nbsp;Zhaxi Suonan,&nbsp;Hanxiang Wu,&nbsp;Yanyan Geng,&nbsp;Manyu Wang,&nbsp;Huiwen Xu,&nbsp;Li Guan,&nbsp;Fei Pang,&nbsp;Wei Ji,&nbsp;Rui Xu,&nbsp;Zhihai Cheng","doi":"10.1007/s11467-024-1409-4","DOIUrl":null,"url":null,"abstract":"<div><p>The van der Waals interface structures and behaviors are of great importance in determining the physical properties of two-dimensional atomic crystals and their heterostructures. The delicate interfacial properties are sensitively dependent on the mechanical behaviors of atomically thin films under external strain. Here, we investigated the strain-engineered rippling structures at the CVD-grown bilayer-MoS<sub>2</sub> interface with advanced atomic force microscopy (AFM). The in-plane compressive strain is sequentially introduced into the 1L-substrate and 2L-1L interface of bilayer-MoS<sub>2</sub> flakes via a fast-cooling process. The thermal strain-engineered rippling structures were directly visualized at the central 2H- and 3R-MoS<sub>2</sub> bilayer regions with friction force microscopy (FFM) and bimodal AFM techniques. These rippling structures can be further artificially manipulated into the beating-like rippling features and fully erased via the contact mode AFM scanning. Our results shed lights on the strain-engineered interfacial structures of two-dimensional materials and also inspire the further investigation on the interface engineering of their electronic and optical properties.</p><div><figure><div><div><picture><source><img></source></picture></div></div></figure></div></div>","PeriodicalId":573,"journal":{"name":"Frontiers of Physics","volume":"19 6","pages":""},"PeriodicalIF":6.5000,"publicationDate":"2024-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Frontiers of Physics","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1007/s11467-024-1409-4","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"PHYSICS, MULTIDISCIPLINARY","Score":null,"Total":0}
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Abstract

The van der Waals interface structures and behaviors are of great importance in determining the physical properties of two-dimensional atomic crystals and their heterostructures. The delicate interfacial properties are sensitively dependent on the mechanical behaviors of atomically thin films under external strain. Here, we investigated the strain-engineered rippling structures at the CVD-grown bilayer-MoS2 interface with advanced atomic force microscopy (AFM). The in-plane compressive strain is sequentially introduced into the 1L-substrate and 2L-1L interface of bilayer-MoS2 flakes via a fast-cooling process. The thermal strain-engineered rippling structures were directly visualized at the central 2H- and 3R-MoS2 bilayer regions with friction force microscopy (FFM) and bimodal AFM techniques. These rippling structures can be further artificially manipulated into the beating-like rippling features and fully erased via the contact mode AFM scanning. Our results shed lights on the strain-engineered interfacial structures of two-dimensional materials and also inspire the further investigation on the interface engineering of their electronic and optical properties.

Abstract Image

通过先进的原子力显微镜识别双分子层-MoS2界面上的应变工程波纹
范德华界面结构和行为对决定二维原子晶体及其异质结构的物理性质非常重要。微妙的界面特性敏感地依赖于原子薄膜在外部应变下的机械行为。在这里,我们利用先进的原子力显微镜(AFM)研究了 CVD 生长的双层膜-MoS2 界面的应变工程波纹结构。通过快速冷却过程,将平面内压应变依次引入双电层-MoS2 薄片的 1L- 基质和 2L-1L 界面。利用摩擦力显微镜(FFM)和双模原子力显微镜(AFM)技术,可以直接观察到在 2H 和 3R-MoS2 双分子层中心区域的热应变工程波纹结构。这些波纹结构可以进一步被人为地操纵成类似跳动的波纹特征,并通过接触模式原子力显微镜扫描完全消除。我们的研究结果揭示了二维材料的应变工程界面结构,同时也启发了人们进一步研究其电子和光学性能的界面工程。
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来源期刊
Frontiers of Physics
Frontiers of Physics PHYSICS, MULTIDISCIPLINARY-
CiteScore
9.20
自引率
9.30%
发文量
898
审稿时长
6-12 weeks
期刊介绍: Frontiers of Physics is an international peer-reviewed journal dedicated to showcasing the latest advancements and significant progress in various research areas within the field of physics. The journal's scope is broad, covering a range of topics that include: Quantum computation and quantum information Atomic, molecular, and optical physics Condensed matter physics, material sciences, and interdisciplinary research Particle, nuclear physics, astrophysics, and cosmology The journal's mission is to highlight frontier achievements, hot topics, and cross-disciplinary points in physics, facilitating communication and idea exchange among physicists both in China and internationally. It serves as a platform for researchers to share their findings and insights, fostering collaboration and innovation across different areas of physics.
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