Time-resolved Raman spectroscopy study of rapid compressed silicon and its potential as a Raman pressure scale in a dynamic diamond anvil cell

IF 2.4 3区化学 Q2 SPECTROSCOPY

Journal of Raman Spectroscopy Pub Date : 2024-05-25 DOI:10.1002/jrs.6703

XiaoHui Chen, Yi Zhang, Lei Liu, Shijia Ye, Shourui Li, Qiumin Jing, Junjie Gao, Hao Wang, Chuanlong Lin, Jun Li

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Abstract

The nature of the nonequilibrium states of materials upon rapid compression/decompression processes in the intermediate regime, between static and shock compression, is an emerging field of high pressure research. Rapid compression experiments were performed to examine the structural response of silicon (Si) up to 11 GPa and over compression rates ranging from 0.011 to 0.325 GPa/s, using a piezo-driven dynamic diamond anvil cell (dDAC) coupled with time-resolved Raman spectroscopy. The observed structural stability and the remarkable consistency in the pressure-dependent Raman shift of the diamond cubic Si (Si-I) showed its high potential as a Raman pressure scale for compression rate below 0.325 GPa/s. The validity of the derived Si scale was verified by in situ continuously monitoring pressure of two rapid compressed samples, that is, gypsum and ZnO. Results indicated that pressures determined using Si were in good agreement with those estimated from the ruby scale. Success in pressure calibration with Si, during time-resolved Raman spectroscopy measurements of material under rapid compression using a dDAC, will greatly simplify the required hardware system in home-laboratory and may also help in reaching a higher signal-to-noise in Raman measurement on a short time scale.

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快速压缩硅的时间分辨拉曼光谱研究及其在动态金刚石砧室中作为拉曼压力标尺的潜力

在介于静态压缩和冲击压缩之间的中间状态下，材料在快速压缩/减压过程中的非平衡态性质是高压研究的一个新兴领域。利用压电驱动的动态金刚石砧室（dDAC）和时间分辨拉曼光谱，进行了快速压缩实验，以检测硅（Si）在 11 GPa 和 0.011 至 0.325 GPa/s 的压缩率范围内的结构响应。观察到的结构稳定性和金刚石立方 Si（Si-I）随压力变化的拉曼位移的显著一致性表明，在压缩率低于 0.325 GPa/s 的情况下，Si-I 具有作为拉曼压力标度的巨大潜力。通过对两种快速压缩样品（石膏和氧化锌）的压力进行现场连续监测，验证了推导出的 Si 标度的有效性。结果表明，使用硅确定的压力与根据红宝石标度估算的压力非常一致。在使用 dDAC 对快速压缩下的材料进行时间分辨拉曼光谱测量时，使用硅成功地进行了压力校准，这将大大简化家庭实验室所需的硬件系统，也有助于在短时间内达到更高的拉曼测量信噪比。

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来源期刊

Journal of Raman Spectroscopy 物理-光谱学

CiteScore

5.40

自引率

8.00%

发文量

185

审稿时长

3.0 months

期刊介绍： The Journal of Raman Spectroscopy is an international journal dedicated to the publication of original research at the cutting edge of all areas of science and technology related to Raman spectroscopy. The journal seeks to be the central forum for documenting the evolution of the broadly-defined field of Raman spectroscopy that includes an increasing number of rapidly developing techniques and an ever-widening array of interdisciplinary applications. Such topics include time-resolved, coherent and non-linear Raman spectroscopies, nanostructure-based surface-enhanced and tip-enhanced Raman spectroscopies of molecules, resonance Raman to investigate the structure-function relationships and dynamics of biological molecules, linear and nonlinear Raman imaging and microscopy, biomedical applications of Raman, theoretical formalism and advances in quantum computational methodology of all forms of Raman scattering, Raman spectroscopy in archaeology and art, advances in remote Raman sensing and industrial applications, and Raman optical activity of all classes of chiral molecules.