X-RAY DENSITY OF BONE TISSUES OF THE DENTOGNATHIC APPARATUS IN CHILDREN WITH CONGENITAL UNILATERAL CLEFT LIP AND PALATE

V. Filonenko, Oleksandr Kaniura, A. Kopchak, Yuriі Kiriienko
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Abstract

Relevance: Physico-mechanical characteristics of the bone tissue of the jaws, in particular its density, determine the efficacy of orthodontic interventions and are a determining parameter when calculating the forces acting on the tissue via orthodontic appliances. Hounsfield X-ray attenuation scale (HU) was used to quantify density during computed tomography. The aim to analyze the X-ray density of bone tissue of the upper jaw in children with congenital unilateral cleft lip and palate using the method of computed tomography of the skull. Materials and methods: The subject of the analysis were measurement data of the X-ray density of bone tissues of the upper jaw of 42 children in the areas that correspond to the maximum stress under the influence of orthodontic appliances. Results: It was clinically established that among all patients included in the study group, cases with left-sided clefts quantitatively dominate over right-sided ones. The results of measurements in the younger age group at the points of intersection of the compact plates of the floor of the maxillary sinus and the zygomatic alveolar ridge (ZAS and ZAI) indicate that the density is 16.6% higher on the healthy side than on the cleft side; 17.6% higher on the healthy side in the most concave points of the nasolabial buttress (NS and NI); and 14.9% higher on the healthy side at the junction of the compact plate of the hump of the upper jaw and the sphenoid bone (TSS and TSI). The zygomatic process of the upper jaw at the level of the zygomatic-maxillary suture (ZZS and ZZI) is the only site where the results on the healthy side and the cleft side did not show a statistically significant difference
先天性单侧唇腭裂患儿牙颌面器骨组织的 X 射线密度
相关性:颌骨骨组织的物理机械特征,尤其是其密度,决定了正畸干预的效果,也是计算正畸装置对骨组织作用力的决定性参数。在进行计算机断层扫描时,Hounsfield X 射线衰减标度(HU)被用来量化密度。目的是使用头骨计算机断层扫描方法分析先天性单侧唇腭裂患儿上颌骨骨组织的 X 射线密度:分析对象是42名儿童在正畸装置影响下最大应力对应区域的上颌骨骨组织X射线密度测量数据:临床结果表明,在研究组的所有患者中,左侧颌骨裂的病例在数量上要多于右侧颌骨裂的病例。在上颌窦底密板与颧骨牙槽嵴交点(ZAS 和 ZAI)对年轻组进行测量的结果表明,健康侧的密度比裂隙侧高 16.6%;在上颌窦底密板与颧骨牙槽嵴交点(ZAS 和 ZAI)对年轻组进行测量的结果表明,健康侧的密度比裂隙侧高 17.6%。在鼻唇沟的最凹点(NS 和 NI),健侧的密度高出 6%;在上颌驼峰密板和蝶骨交界处(TSS 和 TSI),健侧的密度高出 14.9%。上颚颧突位于颧颌缝(ZZS 和 ZZI)的位置是唯一一个健侧和裂侧的结果在统计学上没有显著差异的部位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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