I. Baronchelli, M. Bonato, G. De Zotti, Viviana Casasola, Michele Delli Veneri, Fabrizia Guglielmetti, E. Liuzzo, Rosita Paladino, Leonardo Trobbiani, Martin Zwaan
{"title":"ALMA Band 3 Source Counts: A Machine Learning Approach to Contamination Mitigation below 5 Sigma","authors":"I. Baronchelli, M. Bonato, G. De Zotti, Viviana Casasola, Michele Delli Veneri, Fabrizia Guglielmetti, E. Liuzzo, Rosita Paladino, Leonardo Trobbiani, Martin Zwaan","doi":"10.3390/galaxies12030026","DOIUrl":null,"url":null,"abstract":"We performed differential number counts down to 4.25 sigma using ALMA Band 3 calibrator images, which are known for their high dynamic range and susceptibility to various types of contamination. Estimating the fraction of contaminants is an intricate process due to correlated non-Gaussian noise, and it is often compounded by the presence of false positives generated during the cleaning phase. In addition, calibrator extensions further complicate the counting of background sources. In order to address these challenges, our strategy employs a machine learning-based approach utilizing the UMLAUT algorithm. UMLAUT assigns a value to each detection, and it considers how likely it is for there to be a genuine background source or a contaminant. With respect to this goal, we provide UMLAUT with eight observational input parameters, each automatically weighted using a gradient descent method. Our methodology significantly improves the precision of differential number counts, thus surpassing conventional techniques, including visual inspection. This study contributes to a better understanding of radio sources, particularly in the challenging sub-5 sigma regime, within the complex context of a high dynamic range of ALMA calibrator images.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"28 12","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2024-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/galaxies12030026","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
We performed differential number counts down to 4.25 sigma using ALMA Band 3 calibrator images, which are known for their high dynamic range and susceptibility to various types of contamination. Estimating the fraction of contaminants is an intricate process due to correlated non-Gaussian noise, and it is often compounded by the presence of false positives generated during the cleaning phase. In addition, calibrator extensions further complicate the counting of background sources. In order to address these challenges, our strategy employs a machine learning-based approach utilizing the UMLAUT algorithm. UMLAUT assigns a value to each detection, and it considers how likely it is for there to be a genuine background source or a contaminant. With respect to this goal, we provide UMLAUT with eight observational input parameters, each automatically weighted using a gradient descent method. Our methodology significantly improves the precision of differential number counts, thus surpassing conventional techniques, including visual inspection. This study contributes to a better understanding of radio sources, particularly in the challenging sub-5 sigma regime, within the complex context of a high dynamic range of ALMA calibrator images.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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