H. Al-Yousef, B. M. Alotaibi, A. Atta, E. Abdeltwab, M. M. Abdelhamied
{"title":"Fabrication, surface characterization and effect of oxygen irradiation on polymeric nanocomposite films","authors":"H. Al-Yousef, B. M. Alotaibi, A. Atta, E. Abdeltwab, M. M. Abdelhamied","doi":"10.1142/s0217979225500572","DOIUrl":null,"url":null,"abstract":"This study addressed the preparation of nanocomposites consisting of polyvinyl alcohol (PVA) and titanium oxide (TiO2) for utilization in optoelectronics technologies. PVA/10%TiO2 nanocomposite samples with a mean thickness of 0.1[Formula: see text]mm were created using the solution casting method. The PVA/TiO2 films are irradiated with oxygen fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2. The X-ray diffraction (XRD) and FTIR methodologies were employed to investigate the impact of ion bombardment on the structural characteristics and functional groups of PVA/TiO2 substrates. Diffraction peaks are 20.1° for PVA and 25.4° for TiO2, indicating the successful PVA/TiO2 nanocomposite construction. The absorbance (A) of unirradiated and irradiated samples was measured using UV–Vis spectroscopy within a wavelength range of 200–1100[Formula: see text]nm. Band gaps ([Formula: see text]) were calculated using Tauc’s formula for PVA/TiO2 films, exhibiting a decrease from 4.56[Formula: see text]eV for unirradiated PVA/TiO2 film to 4.16, 3.95 and 3.88[Formula: see text]eV at ion fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2, respectively. Furthermore, the Ubrach tail has a rise of 1.23[Formula: see text]eV for unirradiated PVA/TiO2 to 1.28[Formula: see text]eV, 1.4[Formula: see text]eV and 1.77[Formula: see text]eV for irradiated films with ion fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2, respectively. Additionally, following ion irradiation, the PVA/TiO2 absorption edge [Formula: see text], which was 3.56[Formula: see text]eV, decreased to 3.48, 3.37 and 3.23[Formula: see text]eV, with increasing ion beam fluences. This study demonstrated that the optical behaviors of the PVA/TiO2 films were altered under bombardment, suggesting their potential applicability in optical devices.","PeriodicalId":14108,"journal":{"name":"International Journal of Modern Physics B","volume":null,"pages":null},"PeriodicalIF":2.6000,"publicationDate":"2024-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Modern Physics B","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1142/s0217979225500572","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
This study addressed the preparation of nanocomposites consisting of polyvinyl alcohol (PVA) and titanium oxide (TiO2) for utilization in optoelectronics technologies. PVA/10%TiO2 nanocomposite samples with a mean thickness of 0.1[Formula: see text]mm were created using the solution casting method. The PVA/TiO2 films are irradiated with oxygen fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2. The X-ray diffraction (XRD) and FTIR methodologies were employed to investigate the impact of ion bombardment on the structural characteristics and functional groups of PVA/TiO2 substrates. Diffraction peaks are 20.1° for PVA and 25.4° for TiO2, indicating the successful PVA/TiO2 nanocomposite construction. The absorbance (A) of unirradiated and irradiated samples was measured using UV–Vis spectroscopy within a wavelength range of 200–1100[Formula: see text]nm. Band gaps ([Formula: see text]) were calculated using Tauc’s formula for PVA/TiO2 films, exhibiting a decrease from 4.56[Formula: see text]eV for unirradiated PVA/TiO2 film to 4.16, 3.95 and 3.88[Formula: see text]eV at ion fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2, respectively. Furthermore, the Ubrach tail has a rise of 1.23[Formula: see text]eV for unirradiated PVA/TiO2 to 1.28[Formula: see text]eV, 1.4[Formula: see text]eV and 1.77[Formula: see text]eV for irradiated films with ion fluences of [Formula: see text], [Formula: see text] and [Formula: see text] ions/cm2, respectively. Additionally, following ion irradiation, the PVA/TiO2 absorption edge [Formula: see text], which was 3.56[Formula: see text]eV, decreased to 3.48, 3.37 and 3.23[Formula: see text]eV, with increasing ion beam fluences. This study demonstrated that the optical behaviors of the PVA/TiO2 films were altered under bombardment, suggesting their potential applicability in optical devices.
期刊介绍:
Launched in 1987, the International Journal of Modern Physics B covers the most important aspects and the latest developments in Condensed Matter Physics, Statistical Physics, as well as Atomic, Molecular and Optical Physics. A strong emphasis is placed on topics of current interest, such as cold atoms and molecules, new topological materials and phases, and novel low dimensional materials. One unique feature of this journal is its review section which contains articles with permanent research value besides the state-of-the-art research work in the relevant subject areas.