Optimization of carbon-based thin film microextraction supports for simultaneous detection of heavy metals using LIBS

IF 3.2 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-05-18 DOI:10.1016/j.sab.2024.106948

S. Santini , B. Campanella , S. Giannarelli , V. Palleschi , F. Poggialini , S. Legnaioli

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Abstract

One of the most versatile and effective methods to improve LIBS analysis of liquids is Thin Film Microextraction (TFME).

This approach generally uses carbon-based adsorbent films to extract analytes from a liquid sample and bind them into a solid matrix, which is ideal for LIBS. In a previous work, we demonstrated the feasibility of TFME supports based on graphene prepared by Pulsed Laser Ablation in Liquid (PLAL) for LIBS analysis.

In this paper, we optimized the preparation of such supports for the analysis of heavy metals in aqueous samples (i.e. chromium, lead and nickel), by analyzing both standard solutions and real samples. The feasibility of coupling TFME with NELIBS approach was also exploited. The procedure was applied to the analysis of both mineral water and well water samples.

We obtained a standardized procedure for the extraction of three analytes (Pb, Cr and Ni) and estimated LOD values in spiked mineral water of the order of 0.6 mg/L for LIBS and 0.2 mg/L for NELIBS.

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优化碳基薄膜微萃取支架，利用 LIBS 同时检测重金属

薄膜微萃取（TFME）是改进液体 LIBS 分析的最通用、最有效的方法之一。这种方法通常使用碳基吸附膜从液体样品中萃取分析物，并将其结合到固体基质中，非常适合 LIBS 分析。在之前的工作中，我们证明了基于石墨烯的 TFME 支持物在液中脉冲激光烧蚀（PLAL）制备用于 LIBS 分析的可行性。在本文中，我们通过分析标准溶液和实际样品，优化了这种支持物的制备，用于分析水样中的重金属（即铬、铅和镍）。同时还探讨了将 TFME 与 NELIBS 方法耦合的可行性。我们获得了萃取三种分析物（铅、铬和镍）的标准化程序，并估算出在矿泉水中添加 LIBS 的 LOD 值为 0.6 mg/L，添加 NELIBS 的 LOD 值为 0.2 mg/L。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.