SmartAxis, a software for accurate and rapid zone axis alignment of nanocrystalline materials

IF 17.9 2区材料科学 Q1 Engineering

Nano Materials Science Pub Date : 2025-04-01 DOI:10.1016/j.nanoms.2024.04.006

Jinfei Zhou , Yujiao Wang , Binbin Lu , Jia Lyu , Nini Wei , Jianfeng Huang , Lingmei Liu , Xiao Li , Xinghua Li , Daliang Zhang

{"title":"SmartAxis, a software for accurate and rapid zone axis alignment of nanocrystalline materials","authors":"Jinfei Zhou , Yujiao Wang , Binbin Lu , Jia Lyu , Nini Wei , Jianfeng Huang , Lingmei Liu , Xiao Li , Xinghua Li , Daliang Zhang","doi":"10.1016/j.nanoms.2024.04.006","DOIUrl":null,"url":null,"abstract":"<div><div>Nanocrystals have emerged as cutting-edge functional materials benefiting from the increased surface and enhanced coupling of electronic states. High-resolution imaging in transmission electron microscope can provide invaluable structural information of crystalline materials, albeit it remains greatly challenging to nanocrystals due to the arduousness of accurate zone axis adjustment. Herein, a homemade software package, called SmartAxis, is developed for rapid yet accurate zone axis alignment of nanocrystals. Incident electron beam tilt is employed as an eccentric goniometer to measure the angular deviation of a crystal to a zone axis, and then serves as a linkage to calculate the <em>α</em> and <em>β</em> tilts of goniometer based on an accurate quantitative relationship. In this way, high-resolution imaging of one identical small Au nanocrystal, as well as electron beam-sensitive MIL-101 metal-organic framework crystals, along multiple zone axes, was performed successfully by using this accurate, time- and electron dose-saving zone axis alignment software package.</div></div>","PeriodicalId":33573,"journal":{"name":"Nano Materials Science","volume":"7 2","pages":"Pages 297-303"},"PeriodicalIF":17.9000,"publicationDate":"2025-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Materials Science","FirstCategoryId":"1089","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2589965124000497","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Engineering","Score":null,"Total":0}

引用次数: 0

Abstract

Nanocrystals have emerged as cutting-edge functional materials benefiting from the increased surface and enhanced coupling of electronic states. High-resolution imaging in transmission electron microscope can provide invaluable structural information of crystalline materials, albeit it remains greatly challenging to nanocrystals due to the arduousness of accurate zone axis adjustment. Herein, a homemade software package, called SmartAxis, is developed for rapid yet accurate zone axis alignment of nanocrystals. Incident electron beam tilt is employed as an eccentric goniometer to measure the angular deviation of a crystal to a zone axis, and then serves as a linkage to calculate the α and β tilts of goniometer based on an accurate quantitative relationship. In this way, high-resolution imaging of one identical small Au nanocrystal, as well as electron beam-sensitive MIL-101 metal-organic framework crystals, along multiple zone axes, was performed successfully by using this accurate, time- and electron dose-saving zone axis alignment software package.

查看原文本刊更多论文

智能轴（SmartAxis），一款用于准确、快速对准纳米晶体材料区轴的软件

纳米晶体已经成为一种尖端的功能材料，得益于其表面的增加和电子态的增强耦合。透射电子显微镜的高分辨率成像可以提供宝贵的晶体材料的结构信息，但由于精确的区轴调整困难，对纳米晶体来说仍然是一个很大的挑战。在这里，一个自制的软件包，称为SmartAxis，开发了快速而准确的纳米晶体区域轴对齐。采用入射电子束倾角作为偏心测角仪，测量晶体与带轴的角偏差，然后根据精确的定量关系作为连杆计算测角仪的α和β倾角。通过这种方式，使用这个精确的、节省时间和电子剂量的区域轴校准软件包，成功地对一个相同的小金纳米晶体以及电子束敏感的MIL-101金属有机框架晶体沿多个区域轴进行了高分辨率成像。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Nano Materials Science Engineering-Mechanics of Materials

CiteScore

20.90

自引率

3.00%

发文量

294

审稿时长

9 weeks

期刊介绍： Nano Materials Science (NMS) is an international and interdisciplinary, open access, scholarly journal. NMS publishes peer-reviewed original articles and reviews on nanoscale material science and nanometer devices, with topics encompassing preparation and processing; high-throughput characterization; material performance evaluation and application of material characteristics such as the microstructure and properties of one-dimensional, two-dimensional, and three-dimensional nanostructured and nanofunctional materials; design, preparation, and processing techniques; and performance evaluation technology and nanometer device applications.