An OLED display driver IC with high-gain fast-slew circuit and on-the-fly self-repair technique for high-resolution display

IF 1.7 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Yun-Rae Jo, Chanbong Yu, Jungmoon Kim, Jeeyeon Eom, Jeonghoon Choi, Yunseok Jang, Woo-Nyoung Lee, Jihyun Lee, Hyun-Wook Lim, Siwoo Kim, Jae-Youl Lee
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引用次数: 0

Abstract

This paper presents an OLED display driver IC with high-gain fast-slew (HGFS) and on-the-fly self-repair (OFSR) circuits for a spatial resolution of WQHD and a frame rate of 120 Hz. The proposed HGFS circuit increases the slewing current of the unity-gain amplifier of the source driver when the input voltage is largely changed, reducing the settling time of the source driver as the resolution and frame rate increase. To enhance image quality by correcting line defects, the OFSR circuit replaces a faulty channel with a spare dummy channel. The OLED display driver IC was manufactured using a 28-nm high-voltage process with 8 V/20 V transistors and has 2880 source drivers for WQHD display. The measurement results indicate a horizontal line time of 2.7 μs with a slew rate of 7.675 V/μs, supporting WQHD resolution and 120-Hz frame rate. The displayed image demonstrates that the vertical line defect has disappeared with the use of OFSR.

采用高增益快速回扫电路和实时自修复技术的 OLED 显示屏驱动集成电路,用于高分辨率显示屏
本文介绍了一种具有高增益快速回转(HGFS)和实时自修复(OFSR)电路的 OLED 显示驱动器集成电路,其空间分辨率为 WQHD,帧频为 120 Hz。当输入电压发生较大变化时,拟议的 HGFS 电路会增加源驱动器单增益放大器的回转电流,从而随着分辨率和帧速率的提高而缩短源驱动器的稳定时间。为了通过纠正线路缺陷来提高图像质量,OFSR 电路用备用假通道来替换有故障的通道。OLED 显示驱动器集成电路采用 28 纳米高压工艺制造,配备 8 V/20 V 晶体管,具有用于 WQHD 显示的 2880 个源驱动器。测量结果表明,水平线时间为 2.7 μs,压摆率为 7.675 V/μs,支持 WQHD 分辨率和 120-Hz 帧频。显示的图像表明,使用 OFSR 后,垂直线缺陷已经消失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of the Society for Information Display
Journal of the Society for Information Display 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.70%
发文量
98
审稿时长
3 months
期刊介绍: The Journal of the Society for Information Display publishes original works dealing with the theory and practice of information display. Coverage includes materials, devices and systems; the underlying chemistry, physics, physiology and psychology; measurement techniques, manufacturing technologies; and all aspects of the interaction between equipment and its users. Review articles are also published in all of these areas. Occasional special issues or sections consist of collections of papers on specific topical areas or collections of full length papers based in part on oral or poster presentations given at SID sponsored conferences.
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