Transient analysis of growth/decay in materials utilizing a digital exponential peeling method

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Jayjit Mukherjee, Amit Malik, Seema Vinayak, Vikram Kumar, D. S. Rawal, R. S. Dhaka
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引用次数: 0

Abstract

An algorithm is proposed to implement digital peeling to determine dominant time constants of an exponential transient process. The method is simpler to implement and reduces computational time to a large extent in comparison to other techniques widely used. Apart from a synthetic test function, the algorithm has been implemented on reported experimental transient decay curves of Cs2HfCl6 (CHC) single crystal scintillation to verify its efficacy. Finally, drain current detrapping transients of unpassivated AlGaN/GaN high electron mobility transistors (HEMTs) are analyzed to determine the trap energy levels and concentrations. The validation of this digital peeling technique is also carried out by comparing with conventional method of time constant extraction from HEMT current transients. The extracted exponentials from the transient data efficiently fits well with the experimental data and can be extensively used for transient analysis. The digital peeling technique has wide applicability and can be used to analyze all exponential processes which occur in all domains of science.

利用数字指数剥离法对材料中的生长/衰减进行瞬态分析
本文提出了一种采用数字剥离法确定指数瞬态过程主导时间常数的算法。与其他广泛使用的技术相比,该方法更易于实施,并在很大程度上减少了计算时间。除了合成测试函数外,该算法还在 Cs2HfCl6 (CHC) 单晶闪烁实验瞬态衰减曲线上得到了应用,以验证其有效性。最后,分析了未钝化氮化铝/氮化镓高电子迁移率晶体管(HEMT)的漏极电流俘获瞬态,以确定俘获能级和浓度。通过与从 HEMT 电流瞬态中提取时间常数的传统方法进行比较,还对这种数字剥离技术进行了验证。从瞬态数据中提取的指数与实验数据十分吻合,可广泛用于瞬态分析。数字剥离技术具有广泛的适用性,可用于分析所有科学领域中出现的所有指数过程。
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来源期刊
CiteScore
4.60
自引率
6.20%
发文量
101
审稿时长
>12 weeks
期刊介绍: Prediction through modelling forms the basis of engineering design. The computational power at the fingertips of the professional engineer is increasing enormously and techniques for computer simulation are changing rapidly. Engineers need models which relate to their design area and which are adaptable to new design concepts. They also need efficient and friendly ways of presenting, viewing and transmitting the data associated with their models. The International Journal of Numerical Modelling: Electronic Networks, Devices and Fields provides a communication vehicle for numerical modelling methods and data preparation methods associated with electrical and electronic circuits and fields. It concentrates on numerical modelling rather than abstract numerical mathematics. Contributions on numerical modelling will cover the entire subject of electrical and electronic engineering. They will range from electrical distribution networks to integrated circuits on VLSI design, and from static electric and magnetic fields through microwaves to optical design. They will also include the use of electrical networks as a modelling medium.
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