S. A. Mikheev, E. M. Semenova, Yu. G. Pastushenkov, V. P. Tsvetkov, I. V. Tsvetkov
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引用次数: 0
Abstract
The study of the fractal properties of the surface of Nd100 – xFex alloys in a wide range of concentrations х (х = 20–90) was carried out in the framework of the fractal thermodynamics model. To this end, we performed an analysis of scanning electron microscopy images of the surfaces of a series of Nd100 – xFex alloys synthesized by induction melting. A high degree of proximity of the surface structure of all the studied samples, both before and after etching, to fractals is shown. The values of the parameter δ characterizing the relative deviation of the studied samples from the fractal are in the range of 0.017–0.029. Three-dimensional diagrams of the fractal parameters Sf, Tf, Ef, and x and two-dimensional diagrams of the same parameters Sf, Tf, Ef, and x reflecting the nature of the state of the surfaces of Nd100 – xFex alloy samples before and after etching are constructed. For all investigated alloy samples, the values of the parameters of the fractal equations of state are calculated. The correlation of the maximum value of the coercive force Hc = 4.8 kE with the values of fractal entropy Sf = 39.86, fractal temperature Tf = 529, and fractal dimension D = 2.6530 of the Nd100 – xFex alloys at x = 20 has been established.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.