A rail-to-rail high speed comparator with LVDS output in 0.18-μm SiGe BiCMOS Technology

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Qiyan Sun , Ruiyong Tu , Jin Xie , Yihong Gong , Sini Wu , Jinghu Li , Zhicong Luo
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引用次数: 0

Abstract

Achieving low propagation delay in comparators under low input overdrive voltage is challenging. To overcome this difficulty, this paper presents a novel rail-to-rail high-speed comparator. By clamping the output node of the current summation circuit relative to a fixed level VC, the overdrive recovery time under large signal is successfully reduced. Moreover,by adopting a cascaded approach with multiple stages of high bandwidth and low gain,not only is the comparator’s gain enhanced,but it also acquires higher bandwidth. Ultimately, the comparator’s output is transmitted at high speed through an LVDS interface. This design is implemented using 0.18μm SiGe BiCMOS technology. Simulation results show that the comparator has a static power consumption of 26.4 mW, and for 5 mV input overdrive, the average propagation delay is about 1.09 ns.

采用 0.18μm SiGe BiCMOS 技术制造的具有 LVDS 输出的轨至轨高速比较器
在低输入过驱动电压下实现比较器的低传播延迟具有挑战性。为了克服这一困难,本文提出了一种新型轨至轨高速比较器。通过将电流求和电路的输出节点相对于固定电平 VC 进行箝位,成功缩短了大信号下的过驱动恢复时间。此外,通过采用多级高带宽、低增益的级联方法,不仅提高了比较器的增益,还获得了更高的带宽。比较器的输出最终通过 LVDS 接口高速传输。该设计采用 0.18μm SiGe BiCMOS 技术实现。仿真结果表明,该比较器的静态功耗为 26.4 mW,在 5 mV 输入过驱动条件下,平均传播延迟约为 1.09 ns。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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