A study on the reduction of microstructural non-uniformity in Ni-multilayer ceramic capacitors via repeated highly accelerated life tests and analyses of degraded local areas

Abstract

The degree of microstructural non-uniformity and the lifetime extension of multilayer ceramic capacitors (MLCCs) were evaluated by repeating the fabrication of “prebreakdown” MLCCs through highly accelerated life tests (HALTs), the removal of the insulation resistance-degraded layer, and the reformation of the terminal electrode. The total mean time to failure (MTTF) tended to extend and converge as HALTs were repeated. Microstructural analysis in the degraded local area revealed a clear correlation between the shorter lifetime and the minimum number of grains per unit dielectric layer. After HALTs were repeated, the number of grains came close to and converged as much as undegraded areas over a longer lifetime. These results imply that degradation occurs in order from the greatest degree of microstructural non-uniformity and that the weakest-link model can be understood by treating the lifetime as MTTF.