Non-Destructive Single-Revolution Electron Beam Profilometer based on a CCD Camera

Abstract

CCD cameras are easy to use and are quite widespread in the optical diagnostics of beams in particle accelerators. The exposure time of these cameras is milliseconds, so they are usually used in a cumulative mode to monitor the circulating beams. The images from the cameras contain information about the transverse distribution of particles in the beam and the position of the center of mass of the beam. In this paper, using the example of CCD cameras installed on the electron-positron collider VEPP-2000, the possibility of their use in the mode of a single beam flight through the observation site is investigated. The intensity of the luminous flux of the optical part of the synchrotron radiation spectrum of the beam was estimated and an image of the transverse distribution of particles in the beam in a single-span mode was experimentally obtained, which confirms the potential for expanding the scope of this diagnostic system. A trial signal processing was done as a demonstration of the determination of the beam parameters by the method under study.