Review of: "The conceptual design of focused ion beam nanolithography uses and integrates similar components: sources, extraction and acceleration, optics, scan coils, sample stage, electron detectors, etc. Interestingly, the focused ion beam nanolithography equipment"
{"title":"Review of: \"The conceptual design of focused ion beam nanolithography uses and integrates similar components: sources, extraction and acceleration, optics, scan coils, sample stage, electron detectors, etc. Interestingly, the focused ion beam nanolithography equipment\"","authors":"Serena Amelia","doi":"10.32388/biwbqx","DOIUrl":null,"url":null,"abstract":"<jats:p/>","PeriodicalId":503632,"journal":{"name":"Qeios","volume":"61 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Qeios","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.32388/biwbqx","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}