Level assessment of 87Rb in rubidium-filled MEMS vapor cells by X-ray imaging for atomic magnetometers

IF 1.5 4区 物理与天体物理 Q3 PHYSICS, APPLIED
Minwei Jiang, Jian Wang, Hao Zhai, Chen Chen, Qi Zhang, Dongmin Wu, Baoshun Zhang, Zhongming Zeng, Jie Lin, Yiqun Wang, Chunyu Jiang, Peng Jin
{"title":"Level assessment of 87Rb in rubidium-filled MEMS vapor cells by X-ray imaging for atomic magnetometers","authors":"Minwei Jiang, Jian Wang, Hao Zhai, Chen Chen, Qi Zhang, Dongmin Wu, Baoshun Zhang, Zhongming Zeng, Jie Lin, Yiqun Wang, Chunyu Jiang, Peng Jin","doi":"10.35848/1347-4065/ad43ce","DOIUrl":null,"url":null,"abstract":"\n Quantitative assessments of the level and lifetime of alkali metal in the atomic vapor cells are essential for improving the stability of atomic magnetometers. In this paper, a fast and non-destructive approach is proposed to directly characterize the level of 87Rb in a hermetic MEMS vapor cell. The MEMS-compatible 87Rb evaporation technique is developed to dispense 87Rb in the vapor cells with high efficiency. The morphology of the metallic 87Rb in the MEMS vapor cell is visualized by the non-destructive X-ray technique, and the measured contact angle is 43° ± 2°. Combined with the image recognition, the quantitative characterization of the 87Rb is achieved, and the consumption rates of 87Rb in MEMS cells are experimentally investigated. The presented approach is beneficial for the fabrication and performance enhancement of vapor cells for atomic magnetometers.","PeriodicalId":14741,"journal":{"name":"Japanese Journal of Applied Physics","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2024-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Japanese Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.35848/1347-4065/ad43ce","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0

Abstract

Quantitative assessments of the level and lifetime of alkali metal in the atomic vapor cells are essential for improving the stability of atomic magnetometers. In this paper, a fast and non-destructive approach is proposed to directly characterize the level of 87Rb in a hermetic MEMS vapor cell. The MEMS-compatible 87Rb evaporation technique is developed to dispense 87Rb in the vapor cells with high efficiency. The morphology of the metallic 87Rb in the MEMS vapor cell is visualized by the non-destructive X-ray technique, and the measured contact angle is 43° ± 2°. Combined with the image recognition, the quantitative characterization of the 87Rb is achieved, and the consumption rates of 87Rb in MEMS cells are experimentally investigated. The presented approach is beneficial for the fabrication and performance enhancement of vapor cells for atomic magnetometers.
通过 X 射线成像评估原子磁强计中充满铷的 MEMS 蒸汽电池中 87Rb 的水平
对原子蒸气电池中碱金属的含量和寿命进行定量评估对于提高原子磁强计的稳定性至关重要。本文提出了一种快速、非破坏性的方法,可直接表征密封 MEMS 蒸汽电池中的 87Rb 含量。开发了与 MEMS 兼容的 87Rb 蒸发技术,以高效率在蒸气电池中分配 87Rb。通过无损 X 射线技术观察了 MEMS 蒸汽电池中金属 87Rb 的形态,测得的接触角为 43° ± 2°。结合图像识别,实现了 87Rb 的定量表征,并通过实验研究了 87Rb 在 MEMS 电池中的消耗率。所提出的方法有利于原子磁强计蒸汽电池的制造和性能提升。
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来源期刊
Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 物理-物理:应用
CiteScore
3.00
自引率
26.70%
发文量
818
审稿时长
3.5 months
期刊介绍: The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP). JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields: • Semiconductors, dielectrics, and organic materials • Photonics, quantum electronics, optics, and spectroscopy • Spintronics, superconductivity, and strongly correlated materials • Device physics including quantum information processing • Physics-based circuits and systems • Nanoscale science and technology • Crystal growth, surfaces, interfaces, thin films, and bulk materials • Plasmas, applied atomic and molecular physics, and applied nuclear physics • Device processing, fabrication and measurement technologies, and instrumentation • Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS
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