Modulated illumination microscopy: Application perspectives in nuclear nanostructure analysis

IF 1.5 4区 工程技术 Q3 MICROSCOPY
Christoph Cremer, Florian Schock, Antonio Virgilio Failla, Udo Birk
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Abstract

The structure of the cell nucleus of higher organisms has become a major topic of advanced light microscopy. So far, a variety of methods have been applied, including confocal laser scanning fluorescence microscopy, 4Pi, STED and localisation microscopy approaches, as well as different types of patterned illumination microscopy, modulated either laterally (in the object plane) or axially (along the optical axis). Based on our experience, we discuss here some application perspectives of Modulated Illumination Microscopy (MIM) and its combination with single‐molecule localisation microscopy (SMLM). For example, spatially modulated illumination microscopy/SMI (illumination modulation along the optical axis) has been used to determine the axial extension (size) of small, optically isolated fluorescent objects between ≤ 200 nm and ≥ 40 nm diameter with a precision down to the few nm range; it also allows the axial positioning of such structures down to the 1 nm scale; combined with laterally structured illumination/SIM, a 3D localisation precision of ≤1 nm is expected using fluorescence yields typical for SMLM applications. Together with the nanosizing capability of SMI, this can be used to analyse macromolecular nuclear complexes with a resolution approaching that of cryoelectron microscopy.
调制照明显微镜:核纳米结构分析的应用前景
高等生物的细胞核结构已成为高级光学显微镜的一个重要课题。迄今为止,已经应用了多种方法,包括共焦激光扫描荧光显微镜、4Pi、STED 和定位显微镜方法,以及不同类型的图案照明显微镜,这些方法或横向(在物体平面上)或轴向(沿光轴)调制。根据我们的经验,我们在此讨论调制照明显微镜(MIM)的一些应用前景及其与单分子定位显微镜(SMLM)的结合。例如,空间调制照明显微镜/SMI(沿光轴的照明调制)已被用于确定直径≤ 200 nm 和≥ 40 nm 之间的小型光隔离荧光物体的轴向延伸(尺寸),其精度可低至几个 nm 范围;它还允许对此类结构进行低至 1 nm 的轴向定位;与横向结构照明/SIM 相结合,使用 SMLM 应用的典型荧光产量,三维定位精度有望达到≤1 nm。结合 SMI 的纳米化能力,可用于分析大分子核复合体,其分辨率接近冷冻电镜。
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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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