Ir Transparency of Thin Bismuth Films

IF 0.8 4区物理与天体物理 Q4 OPTICS

Optics and Spectroscopy Pub Date : 2024-04-01 DOI:10.1134/s0030400x23100223

E. Yu. Shamparov, A. L. Bugrimov, S. V. Rode, I. N. Jagrina

引用次数: 0

Abstract

The infrared transmission and reflection spectra of a series of samples of bismuth films of different thicknesses on identical single-crystal silicon substrates were measured. Transmission and reflection oscillations caused by interference on the film thickness are investigated. Properties of Si-plates are estimated. Refractive index and absorption index of bismuth are calculated.

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铋薄膜的 Ir 透明度

摘要在相同的单晶硅衬底上测量了一系列不同厚度铋薄膜样品的红外透射和反射光谱。研究了由薄膜厚度干扰引起的透射和反射振荡。估算了硅板的特性。计算了铋的折射率和吸收率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Optics and Spectroscopy 物理-光谱学

CiteScore

1.60

自引率

0.00%

发文量

审稿时长

4.5 months

期刊介绍： Optics and Spectroscopy (Optika i spektroskopiya), founded in 1956, presents original and review papers in various fields of modern optics and spectroscopy in the entire wavelength range from radio waves to X-rays. Topics covered include problems of theoretical and experimental spectroscopy of atoms, molecules, and condensed state, lasers and the interaction of laser radiation with matter, physical and geometrical optics, holography, and physical principles of optical instrument making.

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