Position Selective Introduction of Ferromagnetism on the Micro‐ and Nanoscale in a Paramagnetic Thin Palladium Film

Petter Ström, C. Vantaraki, Rajdeep Kaur, T. Tran, G. Nagy, V. Kapaklis, Daniel Primetzhofer
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Abstract

Post‐synthetic, position selective addition of properties to materials constitutes a paradigm shifting step in materials engineering. The approach enables creation of material systems inaccessible by equilibrium and near‐equilibrium synthesis, and can be applied in novel practical applications as well as fundamental physics studies over a range of length‐ and energy scales. Ion implantation is a versatile, scalable, industry‐compatible tool, enabling the next step in this development. Here, we employ ion implantation to design and functionalize a mesoscopic magnetic architecture. We utilize a self‐supporting mask combined with implantation of 60 keV Fe ions to create an embedded array of approximately 8 µm wide circular ferromagnetic regions in a Pd film. The approach is contactless, free from surface residues and requires no focusing or scanning of the beam. Magnetic properties of the array are probed with longitudinal magneto‐optic Kerr effect measurement while varying sample temperature and applied magnetic field. Microstructures are visualized with Kerr microscopy and compared to the Fe distribution measured with microbeam proton induced X‐ray emission. Sample topography after implantation is obtained by atomic force microscopy, while ion beam analysis is employed to probe concentration depth profiles of implanted Fe, impurities and to investigate material mixing.This article is protected by copyright. All rights reserved.

Abstract Image

顺磁性钯薄膜在微米和纳米尺度上位置选择性地引入铁磁性
材料的后合成、位置选择性添加特性是材料工程学的一个范式转换步骤。这种方法可以创造出平衡和近平衡合成无法实现的材料系统,并可应用于新颖的实际应用以及一系列长度和能量尺度的基础物理学研究。离子注入是一种多功能、可扩展、与工业兼容的工具,使这一发展迈出了新的一步。在这里,我们采用离子注入技术来设计和功能化介观磁性结构。我们利用自支撑掩模,结合 60 keV 铁离子植入,在钯薄膜中创建了一个宽约 8 µm 的圆形铁磁区域嵌入阵列。这种方法是非接触式的,没有表面残留物,也不需要对光束进行聚焦或扫描。在改变样品温度和外加磁场的同时,利用纵向磁光克尔效应测量法探测阵列的磁特性。利用克尔显微镜观察微结构,并与利用微束质子诱导 X 射线发射测量的铁分布进行比较。植入后的样品形貌由原子力显微镜获得,而离子束分析则用于探测植入的铁、杂质的浓度深度剖面,并研究材料混合情况。本文受版权保护。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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