A tale of three failure-oriented-accelerated-test (FOAT) types and their roles in assuring aerospace electronics-and-photonics reliability: Perspective

Abstract

Our “tale of three failure-oriented-accelerated-test (FOAT) types” includes (chronologically) 1) some product development tests (such as, e.g., shear-off or temperature cycling tests), 2) FOATs at the design stage (that should be applied, when a new technology, a new design or a new application of an existing aerospace electronic or a photonic product is considered, and suitable HALTs are not developed yet) and 3) Burn-in-tests (BITs). Their roles, significance and attributes are indicated and briefly discussed.