Photoreflectance Analysis of InAsPSb/InGaAs Multi-Quantum Well LED Structures with Different Well/Barrier Numbers

Behnam Zeinalvand Farzin, S. Bahareh, S. Ardebili, T. Kang, Jong Su Kim, Phuc Dinh Nguyen, Sang Jun Lee
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Abstract

InAsPSb is an emerging material used as an efficient barrier in quantum well structures, and the resulting devices can be employed in the mid-infrared region of the electromagnetic spectrum. This study investigates the photoreflectance spectra of two InAsPSb/InGaAs multi-quantum well light-emitting diodes with 6 and 15 quantum well periods. The photoreflectance of the samples was analyzed at various temperatures and excitation powers. By examining the Franz-Keldysh oscillations in the spectra, we explored the influence of the number of well layers on the electric field strength in the junction. The results showed that the number of quantum wells can influence the electric field at the junction, potentially impacting the overall performance of the devices. The simulation of the electric field strength aligns with the results of the photoreflectance analysis. This suggests that the field extracted from Franz-Keldysh oscillations characterizes the field inside the multi-quantum wells, offering potential reasons for the observed effects on the number of multi-quantum wells in the field.
具有不同阱/势垒数的 InAsPSb/InGaAs 多量子阱 LED 结构的光反射分析
InAsPSb 是一种新兴材料,可用作量子阱结构中的高效势垒,由此产生的器件可用于电磁波谱的中红外区域。本研究调查了两个具有 6 和 15 量子阱周期的 InAsPSb/InGaAs 多量子阱发光二极管的光反射光谱。分析了样品在不同温度和激发功率下的光反射率。通过研究光谱中的弗朗兹-凯尔迪什振荡,我们探索了阱层数对结内电场强度的影响。结果表明,量子阱的数量会影响交界处的电场,从而对器件的整体性能产生潜在影响。电场强度模拟与光反射分析结果一致。这表明,从弗兰兹-凯尔迪什振荡中提取的场描述了多量子阱内部的场,为观察到的场对多量子阱数量的影响提供了潜在的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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