Junha Hwang, Sejin Kim, Sung Yun Lee, Eunyoung Park, Jaeyong Shin, Jae Hyuk Lee, Myong Jin Kim, Seonghan Kim, Sang Youn Park, Dogeun Jang, Intae Eom, Sangsoo Kim, Changyong Song, Kyung Sook Kim, Daewoong Nam
{"title":"Development of the multiplex imaging chamber at PAL-XFEL.","authors":"Junha Hwang, Sejin Kim, Sung Yun Lee, Eunyoung Park, Jaeyong Shin, Jae Hyuk Lee, Myong Jin Kim, Seonghan Kim, Sang Youn Park, Dogeun Jang, Intae Eom, Sangsoo Kim, Changyong Song, Kyung Sook Kim, Daewoong Nam","doi":"10.1107/S1600577524001218","DOIUrl":null,"url":null,"abstract":"<p><p>Various X-ray techniques are employed to investigate specimens in diverse fields. Generally, scattering and absorption/emission processes occur due to the interaction of X-rays with matter. The output signals from these processes contain structural information and the electronic structure of specimens, respectively. The combination of complementary X-ray techniques improves the understanding of complex systems holistically. In this context, we introduce a multiplex imaging instrument that can collect small-/wide-angle X-ray diffraction and X-ray emission spectra simultaneously to investigate morphological information with nanoscale resolution, crystal arrangement at the atomic scale and the electronic structure of specimens.</p>","PeriodicalId":48729,"journal":{"name":"Journal of Synchrotron Radiation","volume":null,"pages":null},"PeriodicalIF":2.5000,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11075713/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Synchrotron Radiation","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1107/S1600577524001218","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2024/3/22 0:00:00","PubModel":"Epub","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Various X-ray techniques are employed to investigate specimens in diverse fields. Generally, scattering and absorption/emission processes occur due to the interaction of X-rays with matter. The output signals from these processes contain structural information and the electronic structure of specimens, respectively. The combination of complementary X-ray techniques improves the understanding of complex systems holistically. In this context, we introduce a multiplex imaging instrument that can collect small-/wide-angle X-ray diffraction and X-ray emission spectra simultaneously to investigate morphological information with nanoscale resolution, crystal arrangement at the atomic scale and the electronic structure of specimens.
各种 X 射线技术被用于研究不同领域的标本。一般来说，X 射线与物质相互作用会产生散射和吸收/发射过程。这些过程的输出信号分别包含试样的结构信息和电子结构。将互补的 X 射线技术结合起来，可以从整体上提高对复杂系统的理解。在此背景下，我们介绍了一种可同时收集小/广角 X 射线衍射和 X 射线发射光谱的多重成像仪器，以研究纳米级分辨率的形态信息、原子尺度的晶体排列和试样的电子结构。
期刊介绍：
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
