Effect of nanofillers with different energy levels on the electrical properties of epoxy-based nanocomposites

IF 4.4 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
High Voltage Pub Date : 2024-03-18 DOI:10.1049/hve2.12422
Ning Guo, Cailing Chen, Guangwei Zhang, Rongsheng Sun, Yulong Wang, Junguo Gao
{"title":"Effect of nanofillers with different energy levels on the electrical properties of epoxy-based nanocomposites","authors":"Ning Guo,&nbsp;Cailing Chen,&nbsp;Guangwei Zhang,&nbsp;Rongsheng Sun,&nbsp;Yulong Wang,&nbsp;Junguo Gao","doi":"10.1049/hve2.12422","DOIUrl":null,"url":null,"abstract":"<p>The authors investigate the effects of nanofillers with varying band-gap energies on the space charge properties, breakdown field strength, and bulk resistivity of epoxy (EP)-based composites. Additionally, the molecular orbital distribution of both the epoxy resin and nanofillers were examined through density functional theory. Experimental results indicate that the space charge accumulation within silicon dioxide/EP and germanium oxide/EP is reduced, leading to a more uniformly distributed electric field intensity within the specimen when compared to epoxy. As a result, both materials exhibit improved AC breakdown field strength and volume resistivity. Conversely, the amount of charge accumulated within tin dioxide/EP is higher, resulting in lower breakdown field strength than epoxy. The lowest unoccupied molecular orbital and the highest occupied molecular orbital energy level differences between epoxy and nanofillers introduce electron traps and hole traps at the interface, forming interfacial traps that affect the space charge distribution within the specimen, as well as the trap energy levels within the material. From the experimental results, shallow traps promote space charge accumulation and reduce the breakdown field strength, while deep traps have the opposite effect.</p>","PeriodicalId":48649,"journal":{"name":"High Voltage","volume":"9 4","pages":"948-956"},"PeriodicalIF":4.4000,"publicationDate":"2024-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/hve2.12422","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"High Voltage","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/hve2.12422","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

The authors investigate the effects of nanofillers with varying band-gap energies on the space charge properties, breakdown field strength, and bulk resistivity of epoxy (EP)-based composites. Additionally, the molecular orbital distribution of both the epoxy resin and nanofillers were examined through density functional theory. Experimental results indicate that the space charge accumulation within silicon dioxide/EP and germanium oxide/EP is reduced, leading to a more uniformly distributed electric field intensity within the specimen when compared to epoxy. As a result, both materials exhibit improved AC breakdown field strength and volume resistivity. Conversely, the amount of charge accumulated within tin dioxide/EP is higher, resulting in lower breakdown field strength than epoxy. The lowest unoccupied molecular orbital and the highest occupied molecular orbital energy level differences between epoxy and nanofillers introduce electron traps and hole traps at the interface, forming interfacial traps that affect the space charge distribution within the specimen, as well as the trap energy levels within the material. From the experimental results, shallow traps promote space charge accumulation and reduce the breakdown field strength, while deep traps have the opposite effect.

Abstract Image

不同能级的纳米填料对环氧基纳米复合材料电气性能的影响
作者研究了具有不同带隙能量的纳米填料对环氧树脂 (EP) 基复合材料的空间电荷特性、击穿场强和体积电阻率的影响。此外,还通过密度泛函理论研究了环氧树脂和纳米填料的分子轨道分布。实验结果表明,与环氧树脂相比,二氧化硅/EP 和氧化锗/EP 内的空间电荷积累减少,从而使试样内的电场强度分布更均匀。因此,这两种材料的交流击穿场强和体积电阻率都有所提高。相反,二氧化锡/EP 内积累的电荷量较高,导致击穿场强低于环氧树脂。环氧树脂和纳米填料之间的最低未占据分子轨道和最高占据分子轨道能级差异在界面上引入了电子陷阱和空穴陷阱,形成了界面陷阱,影响了试样内部的空间电荷分布以及材料内部的陷阱能级。从实验结果来看,浅陷阱会促进空间电荷的积累并降低击穿场强,而深陷阱则会产生相反的效果。
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来源期刊
High Voltage
High Voltage Energy-Energy Engineering and Power Technology
CiteScore
9.60
自引率
27.30%
发文量
97
审稿时长
21 weeks
期刊介绍: High Voltage aims to attract original research papers and review articles. The scope covers high-voltage power engineering and high voltage applications, including experimental, computational (including simulation and modelling) and theoretical studies, which include: Electrical Insulation ● Outdoor, indoor, solid, liquid and gas insulation ● Transient voltages and overvoltage protection ● Nano-dielectrics and new insulation materials ● Condition monitoring and maintenance Discharge and plasmas, pulsed power ● Electrical discharge, plasma generation and applications ● Interactions of plasma with surfaces ● Pulsed power science and technology High-field effects ● Computation, measurements of Intensive Electromagnetic Field ● Electromagnetic compatibility ● Biomedical effects ● Environmental effects and protection High Voltage Engineering ● Design problems, testing and measuring techniques ● Equipment development and asset management ● Smart Grid, live line working ● AC/DC power electronics ● UHV power transmission Special Issues. Call for papers: Interface Charging Phenomena for Dielectric Materials - https://digital-library.theiet.org/files/HVE_CFP_ICP.pdf Emerging Materials For High Voltage Applications - https://digital-library.theiet.org/files/HVE_CFP_EMHVA.pdf
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