RDMA-Based Sampling Port of ARINC-653

IF 1.7 4区计算机科学 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

IEEE Embedded Systems Letters Pub Date : 2024-03-07 DOI:10.1109/les.2024.3373200

Jong-Bin Lee, Sang-Jae Kim, Wook-Hee Kim, Hyun-Wook Jin

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基于 RDMA 的 ARINC-653 采样端口

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Embedded Systems Letters Engineering-Control and Systems Engineering

CiteScore

3.30

自引率

0.00%

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期刊介绍： The IEEE Embedded Systems Letters (ESL), provides a forum for rapid dissemination of latest technical advances in embedded systems and related areas in embedded software. The emphasis is on models, methods, and tools that ensure secure, correct, efficient and robust design of embedded systems and their applications.