{"title":"Information theory divergences in principal component analysis","authors":"Eduardo K. Nakao, Alexandre L. M. Levada","doi":"10.1007/s10044-024-01215-w","DOIUrl":null,"url":null,"abstract":"<p>The metric learning area studies methodologies to find the most appropriate distance function for a given dataset. It was shown that dimensionality reduction algorithms are closely related to metric learning because, in addition to obtaining a more compact representation of the data, such methods also implicitly derive a distance function that best represents similarity between a pair of objects in the collection. Principal Component Analysis is a traditional linear dimensionality reduction algorithm that is still widely used by researchers. However, its procedure faithfully represents outliers in the generated space, which can be an undesirable characteristic in pattern recognition applications. With this is mind, it was proposed the replacement of the traditional punctual approach by a contextual one based on the data samples neighborhoods. This approach implements a mapping from the usual feature space to a parametric feature space, where the difference between two samples is defined by the vector whose scalar coordinates are given by the statistical divergence between two probability distributions. It was demonstrated for some divergences that the new approach outperforms several existing dimensionality reduction algorithms in a wide range of datasets. Although, it is important to investigate the framework divergence sensitivity. Experiments using Total Variation, Renyi, Sharma-Mittal and Tsallis divergences are exhibited in this paper and the results evidence the method robustness.</p>","PeriodicalId":54639,"journal":{"name":"Pattern Analysis and Applications","volume":"18 1","pages":""},"PeriodicalIF":3.7000,"publicationDate":"2024-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Pattern Analysis and Applications","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1007/s10044-024-01215-w","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
The metric learning area studies methodologies to find the most appropriate distance function for a given dataset. It was shown that dimensionality reduction algorithms are closely related to metric learning because, in addition to obtaining a more compact representation of the data, such methods also implicitly derive a distance function that best represents similarity between a pair of objects in the collection. Principal Component Analysis is a traditional linear dimensionality reduction algorithm that is still widely used by researchers. However, its procedure faithfully represents outliers in the generated space, which can be an undesirable characteristic in pattern recognition applications. With this is mind, it was proposed the replacement of the traditional punctual approach by a contextual one based on the data samples neighborhoods. This approach implements a mapping from the usual feature space to a parametric feature space, where the difference between two samples is defined by the vector whose scalar coordinates are given by the statistical divergence between two probability distributions. It was demonstrated for some divergences that the new approach outperforms several existing dimensionality reduction algorithms in a wide range of datasets. Although, it is important to investigate the framework divergence sensitivity. Experiments using Total Variation, Renyi, Sharma-Mittal and Tsallis divergences are exhibited in this paper and the results evidence the method robustness.
期刊介绍:
The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.