Tongkai Gu;Sitong Yan;Lanlan Wang;Yasheng Chang;Hongzhong Liu
{"title":"High-Quality Light Field Microscope Imaging Based on Microlens Arrays","authors":"Tongkai Gu;Sitong Yan;Lanlan Wang;Yasheng Chang;Hongzhong Liu","doi":"10.1109/JMEMS.2023.3349299","DOIUrl":null,"url":null,"abstract":"High-quality optical observation through traditional microscopes faces significant challenges due to their low spatial sampling and the limited ability to respond only to the light intensity characteristics of optoelectronic devices. This limitation results in an inability to measure other critical optical information during imaging, such as phase, angle, polarization, and coherence. In response to these challenges, light field microscope (LFM) as a powerful imaging technique is capable of measuring samples with unprecedented depth and detail. LFM overcomes the limitations of conventional microscope methods by capturing both spatial and angular information of light rays. To further demonstrate these capabilities, the LFM based on microlens arrays is constructed here. These arrays are fabricated using advanced techniques such as laser lithography, microimprinting, and self-assembly technology. Using light field imaging, image segmentation methods, and deep learning fusion, the imaging quality is nearly doubled, significantly enhancing the quality of observations. LFM based on microlens arrays offers great promise for improving the quality of imaging observations in the field of microsope. [2023-0167]","PeriodicalId":16621,"journal":{"name":"Journal of Microelectromechanical Systems","volume":"33 2","pages":"296-303"},"PeriodicalIF":2.5000,"publicationDate":"2024-01-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Microelectromechanical Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10391065/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
High-quality optical observation through traditional microscopes faces significant challenges due to their low spatial sampling and the limited ability to respond only to the light intensity characteristics of optoelectronic devices. This limitation results in an inability to measure other critical optical information during imaging, such as phase, angle, polarization, and coherence. In response to these challenges, light field microscope (LFM) as a powerful imaging technique is capable of measuring samples with unprecedented depth and detail. LFM overcomes the limitations of conventional microscope methods by capturing both spatial and angular information of light rays. To further demonstrate these capabilities, the LFM based on microlens arrays is constructed here. These arrays are fabricated using advanced techniques such as laser lithography, microimprinting, and self-assembly technology. Using light field imaging, image segmentation methods, and deep learning fusion, the imaging quality is nearly doubled, significantly enhancing the quality of observations. LFM based on microlens arrays offers great promise for improving the quality of imaging observations in the field of microsope. [2023-0167]
期刊介绍:
The topics of interest include, but are not limited to: devices ranging in size from microns to millimeters, IC-compatible fabrication techniques, other fabrication techniques, measurement of micro phenomena, theoretical results, new materials and designs, micro actuators, micro robots, micro batteries, bearings, wear, reliability, electrical interconnections, micro telemanipulation, and standards appropriate to MEMS. Application examples and application oriented devices in fluidics, optics, bio-medical engineering, etc., are also of central interest.