Stimulation-Induced Seizures in Children Undergoing Stereo-EEG Evaluation.

IF 2.3 4区 医学 Q3 CLINICAL NEUROLOGY
Ranjith Kumar Manokaran, Ayako Ochi, Shelly Weiss, Ivanna Yau, Rohit Sharma, Hiroshi Otsubo, George M Ibrahim, Elizabeth J Donner, Puneet Jain
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Abstract

Purpose: This study reports our center's initial experience with the use of low-frequency stimulation in provoking stimulation-induced seizures (SIS) in children with drug-resistant epilepsy undergoing stereo-EEG evaluations.

Methods: This retrospective study enrolled children aged 2 to 18 years with drug-resistant focal epilepsy who underwent stereo-EEG evaluation and extraoperative direct electrical cortical stimulation to elicit seizures. The low-frequency stimulation parameters consisted of biphasic square waveforms at frequency of 1 Hz, pulse width 1 millisecond, current 1 to 3 mA, and train duration of 20 seconds. Various epilepsy-related, imaging, neurophysiology, and surgery-related variables were collected and summarized.

Results: Fourteen children (mean age 13 years; 57.1% girls) were included, 10 of whom had unilateral stereo-EEG coverage. Cortical stimulation for provoking seizures was performed after a median of 5 days after electrode implantation. The median number of electrode-contacts stimulated per patient was 42. Four patients (28.6%) experienced habitual SIS (all extratemporal). The etiology in three patients was focal cortical dysplasia. Interictal high-frequency oscillations at electrode-contacts provoking SIS were observed in three cases (75%). Two of these individuals (50%) had class 1 International League Against Epilepsy seizure outcome at last follow-up, after the resection of the brain regions generating SIS.

Conclusions: Low-frequency (1-Hz) stimulation could provoke habitual SIS in nearly one-fourth of children with focal epilepsy undergoing stereo-EEG monitoring. This study provides a limited pediatric experience with the low-frequency cortical stimulation and SIS.

接受立体电子脑电图评估的儿童中由刺激诱发的癫痫发作。
目的:本研究报告了我们中心在接受立体电子脑电图评估的耐药癫痫患儿中使用低频刺激诱发癫痫发作(SIS)的初步经验:这项回顾性研究招募了 2 至 18 岁患有耐药性局灶性癫痫的儿童,他们接受了立体电子脑电图评估和术外直接皮质电刺激以诱发癫痫发作。低频刺激参数包括频率为 1 赫兹、脉宽为 1 毫秒、电流为 1 至 3 毫安、持续时间为 20 秒的双相方波。收集并总结了各种癫痫相关变量、影像学变量、神经生理学变量和手术相关变量:共纳入 14 名儿童(平均年龄 13 岁;57.1% 为女孩),其中 10 名儿童有单侧立体电子脑电图覆盖。在电极植入后的中位数5天后进行皮层刺激以诱发癫痫发作。每位患者接受刺激的电极接触中位数为 42 个。四名患者(28.6%)出现了习惯性 SIS(均为颞外)。三名患者的病因是局灶性皮质发育不良。在三个病例(75%)中观察到了电极接触引起 SIS 的发作间期高频振荡。其中两名患者(50%)在切除引发SIS的脑区后,最后一次随访时的癫痫发作结果为国际抗癫痫联盟1级:结论:在接受立体脑电图监测的局灶性癫痫患儿中,近四分之一的患儿会因低频(1 赫兹)刺激而诱发习惯性 SIS。这项研究为低频皮层刺激和 SIS 提供了有限的儿科经验。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Clinical Neurophysiology
Journal of Clinical Neurophysiology 医学-临床神经学
CiteScore
4.60
自引率
4.20%
发文量
198
审稿时长
6-12 weeks
期刊介绍: ​The Journal of Clinical Neurophysiology features both topical reviews and original research in both central and peripheral neurophysiology, as related to patient evaluation and treatment. Official Journal of the American Clinical Neurophysiology Society.
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