Jing Liu, Ibrahim Al Keyyam, Yangsu Xie, Xinwei Wang
{"title":"Perspectives on interfacial thermal resistance of 2D materials: Raman characterization and underlying physics","authors":"Jing Liu, Ibrahim Al Keyyam, Yangsu Xie, Xinwei Wang","doi":"10.1007/s44251-024-00037-6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":510857,"journal":{"name":"Surface Science and Technology","volume":"76 7","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s44251-024-00037-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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