Two-Dimensional Visible Synchrotron Radiation Interferometry for Measuring Transverse Beam-Profile at HLS-II

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Instrumentation & Measurement Magazine Pub Date : 2024-02-01 DOI:10.1109/MIM.2024.10423656

Sanshuang Jin, Yunkun Zhao, Ruizhe Wu, Fangfang Wu, Tianyu Zhou, Baogen Sun, Jigang Wang

引用次数: 0

Abstract

Accurate measurement of the transverse beam-profile is critical to analyzing the performance of the electron storage ring light sources. In this paper, a two-dimensional interferometer using the spatial coherence of the synchrotron radiation is developed to measure the transverse beam-profile of Hefei Light Source-II (HLS-II). On the B7 beamline, the transverse beam-profile of this light source point was measured by the interference fringes of Synchrotron Radiation (SR) with wavelength of 500 nm. Under the normal top-off operation mode of HLS-II, the horizontal and vertical beam sizes measured by the interferometer are $291.9\pm 1.6\ \mu\mathrm{m}$ and $241.3\pm 0.9\ \mu\mathrm{m}$, respectively. At the same time, the effect of beam intensity on the transverse beam-profile was also investigated. The interferometer measurement system we designed satisfies the real-time online monitoring of the transverse beam-profile in the top-off operation mode of HLS-II.

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用于测量 HLS-II 横向光束轮廓的二维可见同步辐射干涉仪

精确测量横向光束轮廓对于分析电子存储环光源的性能至关重要。本文开发了一种利用同步辐射空间相干性的二维干涉仪，用于测量合肥光源-II（HLS-II）的横向光束轮廓。在 B7 光束线上，利用波长为 500 nm 的同步辐射（SR）干涉条纹测量了该光源点的横向光束轮廓。在HLS-II的正常顶关工作模式下，干涉仪测得的横向和纵向光束尺寸分别为291.9\pm 1.6\mu\mathrm{m}$和241.3\pm 0.9\mu\mathrm{m}$。同时，我们还研究了光束强度对横向光束轮廓的影响。我们设计的干涉仪测量系统可以满足在HLS-II的顶关运行模式下对横向光束轮廓的实时在线监测。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Instrumentation & Measurement Magazine 工程技术-工程：电子与电气

CiteScore

4.20

自引率

4.80%

发文量

147

审稿时长

>12 weeks

期刊介绍： IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.