Tengfei Wu, Marc Guillon, Gilles Tessier, and Pascal Berto
{"title":"Multiplexed wavefront sensing with a thin diffuser","authors":"Tengfei Wu, Marc Guillon, Gilles Tessier, and Pascal Berto","doi":"10.1364/optica.500780","DOIUrl":null,"url":null,"abstract":"In astronomy or biological imaging, refractive index inhomogeneities of, e.g., atmosphere or tissues, induce optical aberrations that degrade the desired information hidden behind the medium. A standard approach consists of measuring these aberrations with a wavefront sensor (e.g., Shack–Hartmann) located in the pupil plane, and compensating for them either digitally or by adaptive optics with a wavefront shaper. However, in its usual implementation this strategy can only extract aberrations within a single isoplanatic patch, i.e., a region where the aberrations remain correlated. This limitation severely reduces the effective field-of-view in which the correction can be performed. Here, we propose a wavefront sensing method capable of measuring, in a single shot, various pupil aberrations corresponding to multiple isoplanatic patches. The method, based on a thin diffuser (i.e., a random phase mask), exploits the dissimilarity between different speckle regions to multiplex several wavefronts incoming from various incidence angles. We present proof-of-concept experiments carried out in widefield fluorescence microscopy. A digital deconvolution procedure in each isoplanatic patch yields accurate aberration correction within an extended field-of-view. This approach is of interest for adaptive optics applications as well as diffractive optical tomography.","PeriodicalId":19515,"journal":{"name":"Optica","volume":"63 1","pages":""},"PeriodicalIF":8.4000,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optica","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1364/optica.500780","RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
In astronomy or biological imaging, refractive index inhomogeneities of, e.g., atmosphere or tissues, induce optical aberrations that degrade the desired information hidden behind the medium. A standard approach consists of measuring these aberrations with a wavefront sensor (e.g., Shack–Hartmann) located in the pupil plane, and compensating for them either digitally or by adaptive optics with a wavefront shaper. However, in its usual implementation this strategy can only extract aberrations within a single isoplanatic patch, i.e., a region where the aberrations remain correlated. This limitation severely reduces the effective field-of-view in which the correction can be performed. Here, we propose a wavefront sensing method capable of measuring, in a single shot, various pupil aberrations corresponding to multiple isoplanatic patches. The method, based on a thin diffuser (i.e., a random phase mask), exploits the dissimilarity between different speckle regions to multiplex several wavefronts incoming from various incidence angles. We present proof-of-concept experiments carried out in widefield fluorescence microscopy. A digital deconvolution procedure in each isoplanatic patch yields accurate aberration correction within an extended field-of-view. This approach is of interest for adaptive optics applications as well as diffractive optical tomography.
期刊介绍:
Optica is an open access, online-only journal published monthly by Optica Publishing Group. It is dedicated to the rapid dissemination of high-impact peer-reviewed research in the field of optics and photonics. The journal provides a forum for theoretical or experimental, fundamental or applied research to be swiftly accessed by the international community. Optica is abstracted and indexed in Chemical Abstracts Service, Current Contents/Physical, Chemical & Earth Sciences, and Science Citation Index Expanded.