Yuqi Tian, Chun Li, Shengxin Tu, Nathan T. James, Frank E. Harrell, Bryan E. Shepherd
{"title":"Addressing Multiple Detection Limits with Semiparametric Cumulative Probability Models","authors":"Yuqi Tian, Chun Li, Shengxin Tu, Nathan T. James, Frank E. Harrell, Bryan E. Shepherd","doi":"10.1080/01621459.2024.2315667","DOIUrl":null,"url":null,"abstract":"Detection limits (DLs), where a variable cannot be measured outside of a certain range, are common in research. DLs may vary across study sites or over time. Most approaches to handling DLs in resp...","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/01621459.2024.2315667","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Detection limits (DLs), where a variable cannot be measured outside of a certain range, are common in research. DLs may vary across study sites or over time. Most approaches to handling DLs in resp...