Maria Fernanda Villa-Bracamonte , Jose Raul Montes-Bojorquez , Arturo A. Ayon
{"title":"Optical properties study of a perovskite solar cell film stack by spectroscopic ellipsometry and spectrophotometry","authors":"Maria Fernanda Villa-Bracamonte , Jose Raul Montes-Bojorquez , Arturo A. Ayon","doi":"10.1016/j.rio.2024.100640","DOIUrl":null,"url":null,"abstract":"<div><p>Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer modeling approach to investigate the optical properties of the three layers of interest typically employed on an inverted perovskite solar cells structure, namely, indium-tin-oxide (ITO) as a transparent anode, poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) as a hole transport layer, and methylammonium lead iodide (MAPbI<sub>3</sub>) as the perovskite layer. The parameterized optical constants based on oscillator models were simultaneously fitted to ellipsometry and intensity-transmission data and validated with ultraviolet–visible (UV–Vis) spectroscopy and profilometry. We propose this multilayer modeling approach as a method to be employed throughout the different stages of the fabrication process to study the distinct mechanisms that impact the final performance of a photovoltaic device.</p></div>","PeriodicalId":21151,"journal":{"name":"Results in Optics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S2666950124000373/pdfft?md5=1cd4c87d7207ed23553612c8dc602fa1&pid=1-s2.0-S2666950124000373-main.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Results in Optics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2666950124000373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 0
Abstract
Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze the materials. In this work, we report a multilayer modeling approach to investigate the optical properties of the three layers of interest typically employed on an inverted perovskite solar cells structure, namely, indium-tin-oxide (ITO) as a transparent anode, poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) as a hole transport layer, and methylammonium lead iodide (MAPbI3) as the perovskite layer. The parameterized optical constants based on oscillator models were simultaneously fitted to ellipsometry and intensity-transmission data and validated with ultraviolet–visible (UV–Vis) spectroscopy and profilometry. We propose this multilayer modeling approach as a method to be employed throughout the different stages of the fabrication process to study the distinct mechanisms that impact the final performance of a photovoltaic device.