{"title":"FSCIL-EACA: Few-Shot Class-Incremental Learning Network Based on Embedding Augmentation and Classifier Adaptation for Image Classification","authors":"Ruru Zhang;E Haihong;Meina Song;Xun Cao","doi":"10.23919/cje.2022.00.396","DOIUrl":null,"url":null,"abstract":"The ability to learn incrementally is critical to the long-term operation of AI systems. Benefiting from the power of few-shot class-incremental learning (FSCIL), deep learning models can continuously recognize new classes with only a few samples. The difficulty is that limited instances of new classes will lead to overfitting and exacerbate the catastrophic forgetting of the old classes. Most previous works alleviate the above problems by imposing strong constraints on the model structure or parameters, but ignoring embedding network transferability and classifier adaptation (CA), failing to guarantee the efficient utilization of visual features and establishing relationships between old and new classes. In this paper, we propose a simple and novel approach from two perspectives: embedding bias and classifier bias. The method learns an embedding augmented (EA) network with cross-class transfer and class-specific discriminative abilities based on self-supervised learning and modulated attention to alleviate embedding bias. Based on the adaptive incremental classifier learning scheme to realize incremental learning capability, guiding the adaptive update of prototypes and feature embeddings to alleviate classifier bias. We conduct extensive experiments on two popular natural image datasets and two medical datasets. The experiments show that our method is significantly better than the baseline and achieves state-of-the-art results.","PeriodicalId":50701,"journal":{"name":"Chinese Journal of Electronics","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10410591","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Chinese Journal of Electronics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10410591/","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The ability to learn incrementally is critical to the long-term operation of AI systems. Benefiting from the power of few-shot class-incremental learning (FSCIL), deep learning models can continuously recognize new classes with only a few samples. The difficulty is that limited instances of new classes will lead to overfitting and exacerbate the catastrophic forgetting of the old classes. Most previous works alleviate the above problems by imposing strong constraints on the model structure or parameters, but ignoring embedding network transferability and classifier adaptation (CA), failing to guarantee the efficient utilization of visual features and establishing relationships between old and new classes. In this paper, we propose a simple and novel approach from two perspectives: embedding bias and classifier bias. The method learns an embedding augmented (EA) network with cross-class transfer and class-specific discriminative abilities based on self-supervised learning and modulated attention to alleviate embedding bias. Based on the adaptive incremental classifier learning scheme to realize incremental learning capability, guiding the adaptive update of prototypes and feature embeddings to alleviate classifier bias. We conduct extensive experiments on two popular natural image datasets and two medical datasets. The experiments show that our method is significantly better than the baseline and achieves state-of-the-art results.
期刊介绍:
CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.