Advance Radiation Metrology Techniques and Related Applications

IF 1 4区工程技术 Q4 INSTRUMENTS & INSTRUMENTATION

MAPAN Pub Date : 2024-01-10 DOI:10.1007/s12647-023-00729-8

D. K. Aswal, S. K. Jha, A. C. Patra

引用次数: 0

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先进的辐射计量技术及相关应用

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

MAPAN 工程技术-物理：应用

CiteScore

2.30

自引率

20.00%

发文量

审稿时长

3 months

期刊介绍： MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.