The EDFAS FA Technology Roadmap—Die-Level Roadmap Council (DLRC)

Lesly Endrinal, S. H. Goh
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Abstract

The EDFAS Die-Level Roadmap Committee was formed to identify forthcoming challenges related to electrical fault isolation within the next five years and collaborate with various stakeholders, including industry, academia, and tool vendors, to devise practical solutions. To that end, the team has pinpointed five critical areas of focus: (1) laser-based, photon emission, and thermal; (2) 2D/2.5D/3D packaging; (3) product yield, test, and diagnostics; (4) general (leading edge technologies); and (5) system level, analog/RF, and digital functional.
EDFAS FA 技术路线图--芯片级路线图理事会 (DLRC)
EDFAS 芯片级路线图委员会的成立旨在确定未来五年内即将面临的与电气故障隔离相关的挑战,并与包括业界、学术界和工具供应商在内的各利益相关方合作,共同制定切实可行的解决方案。为此,该团队确定了五个关键重点领域:(1) 激光、光子发射和热;(2) 2D/2.5D/3D 封装;(3) 产品良率、测试和诊断;(4) 通用(前沿技术);(5) 系统级、模拟/射频和数字功能。
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