Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

IF 7.5 Q1 CHEMISTRY, PHYSICAL

Applied Surface Science Advances Pub Date : 2024-01-06 DOI:10.1016/j.apsadv.2023.100534

Joshua W. Pinder , George H. Major , Donald R. Baer , Jeff Terry , James E. Whitten , Jan Čechal , Jacob D. Crossman , Alvaro J. Lizarbe , Samira Jafari , Christopher D. Easton , Jonas Baltrusaitis , Matthijs A. van Spronsen , Matthew R. Linford

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Abstract

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

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避免 X 射线光电子能谱数据收集和分析中的常见错误，正确报告仪器参数

尽管为技术界编写了大量有关 X 射线光电子能谱（XPS）的教程和标准，但数据采集、分析和报告方面的困难依然存在。这项工作的重点是科学文献中经常出现的 XPS 常见错误及其来源。事实上，这项工作包括：(i) XPS 数据收集、初始数据分析和数据展示，(ii) 处理 XPS 背景，(iii) XPS 峰值拟合中的常见错误，以及 (iv) XPS 数据展示和报告。提供了错误的图表示例以及处理数据和纠正错误的适当方法。为更深入地探讨所讨论的主题，还列出了其他读物。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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