unDrift: A versatile software for fast offline SPM image drift correction.

IF 2.6 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Beilstein Journal of Nanotechnology Pub Date : 2023-12-28 eCollection Date: 2023-01-01 DOI:10.3762/bjnano.14.101
Tobias Dickbreder, Franziska Sabath, Lukas Höltkemeier, Ralf Bechstein, Angelika Kühnle
{"title":"<i>un</i>Drift: A versatile software for fast offline SPM image drift correction.","authors":"Tobias Dickbreder, Franziska Sabath, Lukas Höltkemeier, Ralf Bechstein, Angelika Kühnle","doi":"10.3762/bjnano.14.101","DOIUrl":null,"url":null,"abstract":"<p><p>Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image series. Here, we present <i>un</i>Drift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. <i>un</i>Drift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any additional reference. The first semi-automatic drift correction algorithm analyzes the different distortion of periodic structures in two consecutive up and down (down and up) images, which enables <i>un</i>Drift to correct SPM images without stationary features or overlapping scan areas. The other two algorithms determine the drift velocity from the apparent movement of stationary features either by automatic evaluation of the cross-correlation image or based on positions identified manually by the user. We demonstrate the performance and reliability of <i>un</i>Drift using three challenging examples, namely images distorted by a very high drift velocity, only partly usable images, and images exhibiting an overall weak contrast. Moreover, we show that the semi-automatic analysis of periodic images can be applied to a long series containing hundreds of images measured at the calcite-water interface.</p>","PeriodicalId":8802,"journal":{"name":"Beilstein Journal of Nanotechnology","volume":"14 ","pages":"1225-1237"},"PeriodicalIF":2.6000,"publicationDate":"2023-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10760460/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Beilstein Journal of Nanotechnology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.3762/bjnano.14.101","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2023/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image series. Here, we present unDrift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. unDrift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any additional reference. The first semi-automatic drift correction algorithm analyzes the different distortion of periodic structures in two consecutive up and down (down and up) images, which enables unDrift to correct SPM images without stationary features or overlapping scan areas. The other two algorithms determine the drift velocity from the apparent movement of stationary features either by automatic evaluation of the cross-correlation image or based on positions identified manually by the user. We demonstrate the performance and reliability of unDrift using three challenging examples, namely images distorted by a very high drift velocity, only partly usable images, and images exhibiting an overall weak contrast. Moreover, we show that the semi-automatic analysis of periodic images can be applied to a long series containing hundreds of images measured at the calcite-water interface.

unDrift:用于快速离线校正 SPM 图像漂移的多功能软件。
扫描探针显微镜(SPM)技术被广泛应用于研究化学和物理学各学科中表面和界面的结构与特性。热)漂移是 SPM 的主要伪影之一,它是样品和探针之间的意外移动,会导致 SPM 记录的数据失真。文献记载了大量在测量过程中(在线漂移校正)或测量后(离线漂移校正)补偿漂移的策略。然而,利用现有的软件工具,对 SPM 数据进行离线漂移校正往往是一项繁琐耗时的工作。这在分析长图像系列时尤其不利。unDrift提供三种不同的算法,可根据两幅连续的SPM图像确定漂移速度。所有算法都能对输入数据进行漂移校正,无需任何额外参考。第一种半自动漂移校正算法分析两个连续的上下(下和上)图像中周期性结构的不同失真,这使得 unDrift 能够校正没有静止特征或重叠扫描区域的 SPM 图像。其他两种算法通过自动评估交叉相关图像或根据用户手动确定的位置,从静止特征的明显移动来确定漂移速度。我们用三个具有挑战性的例子来证明 unDrift 的性能和可靠性,这三个例子是:因极高漂移速度而扭曲的图像、只有部分可用的图像以及整体对比度较弱的图像。此外,我们还展示了周期性图像的半自动分析可以应用于在方解石-水界面测量的包含数百张图像的长序列。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.70
自引率
3.20%
发文量
109
审稿时长
2 months
期刊介绍: The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology. The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.
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