Exploring the effect of interface properties between CeO x electron transport layer and MAPbI3 perovskite layer on solar cell performances through numerical simulation

IF 1.5 4区 物理与天体物理 Q3 PHYSICS, APPLIED
Md. Mahfuzul Haque, Samiya Mahjabin, M. J. Rashid, Hamad F. Alharbi, Takashi Suemasu, Md. Akhtaruzzaman
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引用次数: 0

Abstract

Organo-metal halide perovskite solar cells (PSCs) have received a lot of attention to the photovoltaic research community, mainly due to the rapid development of their cell performances. But industry-level production of PSCs is hindered for several reasons. At present, the use of high-temperature processed electron transport layer (ETL) such as TIO2, the use of chemically unstable ETL such as ZnO and SnO2, etc. are ETL-related obstacles behind this industrialization. Aiming to remove these problems, cerium oxide (CeO x ), one of the most Earth-rich metal oxides has been chosen as ETL for this study. In this study, the SCAPS-1D simulation package has been used for an intensive study on ETL/PSK interface for a methylammonium lead iodide (MAPbI3)-based PSC having CeO x as ETL. From this simulation, the effect of conduction band offset (CBO) between CeO x and MAPbI3 has been found as the key player behind the cell performances. Defects at this interface have also been introduced and varied for studying their effects on cell performance at different CBO values. The temperature stability of a PSC is another important issue that has been considered in this study to find the effect of operating temperature on the PSC. This study would enlighten the researchers in implying some fantastic techniques at the ETL/PSK interface for improving the cell performance that will forward the research community a few steps to use CeO x as a promising ETL in PSC.
通过数值模拟探索 CeO x 电子传输层与 MAPbI3 包晶层之间的界面特性对太阳能电池性能的影响
有机金属卤化物过氧化物太阳能电池(PSCs)受到了光伏研究界的广泛关注,这主要归功于其电池性能的快速发展。但由于多种原因,PSCs 的工业化生产受到阻碍。目前,使用高温加工的电子传输层(ETL)(如 TIO2)、使用化学性质不稳定的电子传输层(ETL)(如 ZnO 和 SnO2)等都是与 ETL 相关的工业化障碍。为了解决这些问题,本研究选择了氧化铈(CeOx)作为 ETL,它是地球上最富集的金属氧化物之一。本研究使用 SCAPS-1D 仿真软件包对以 CeOx 为 ETL 的碘化甲铵铅 (MAPbI3) 基 PSC 的 ETL/PSK 接口进行了深入研究。模拟结果表明,CeOx 和 MAPbI3 之间的导带偏移 (CBO) 是影响电池性能的关键因素。为了研究不同 CBO 值对电池性能的影响,还引入并改变了该界面上的缺陷。PSC 的温度稳定性是本研究考虑的另一个重要问题,目的是找出工作温度对 PSC 的影响。这项研究将启发研究人员在 ETL/PSK 接口上采用一些奇妙的技术来提高电池性能,这将推动研究界在 PSC 中使用 CeOx 作为有前途的 ETL。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 物理-物理:应用
CiteScore
3.00
自引率
26.70%
发文量
818
审稿时长
3.5 months
期刊介绍: The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP). JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields: • Semiconductors, dielectrics, and organic materials • Photonics, quantum electronics, optics, and spectroscopy • Spintronics, superconductivity, and strongly correlated materials • Device physics including quantum information processing • Physics-based circuits and systems • Nanoscale science and technology • Crystal growth, surfaces, interfaces, thin films, and bulk materials • Plasmas, applied atomic and molecular physics, and applied nuclear physics • Device processing, fabrication and measurement technologies, and instrumentation • Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS
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