A new working reference material for cassiterite oxygen isotope microanalysis

IF 1.6 4区 化学 Q4 CHEMISTRY, PHYSICAL
Sheng He, Yang Li, Li-Guang Wu, Rui-Ping Liu, Dong-Fa Guo, Zi-Ying Li, Xian-Hua Li
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Abstract

Cassiterite is the principal ore mineral for tin, and its oxygen isotope is a promising proxy to trace the origin and evolution of ore-forming fluids, which requires precise and accurate oxygen isotopic analysis. Secondary ion mass spectrometry (SIMS) is a powerful tool for oxygen isotope analysis, especially when samples bear complicated textures, but matrix-matched reference materials are critical for accurate microanalysis. The only available matrix-matched reference material for cassiterite oxygen isotope analysis is Yongde-Cst, and more reference materials are required. Here, we report Piaotang-Cst as a potential working reference material for cassiterite oxygen isotope microanalysis. Our extensive SIMS microanalysis confirmed that Piaotang-Cst is relatively homogeneous, with an average two standard deviations (2SD) of 0.49‰ (n = 626). The δ18OVSMOW value of Piaotang-Cst is 5.33 ± 0.07‰ (2SD, n = 5) as determined by a conventional fluorination isotope ratio mass spectrometer. We also demonstrated that there is no measurable matrix effect caused by the variable contents of trace elements for cassiterite oxygen isotope microanalysis. We proposed that the Piaotang-Cst can be used as a working reference material for monitoring the external reproducibility and accuracy of SIMS analysis.
锡石氧同位素显微分析的新工作参考材料
锡石是锡的主要矿石矿物,其氧同位素是追踪成矿流体的起源和演化的理想替代物,这需要精确的氧同位素分析。二次离子质谱法(SIMS)是氧同位素分析的强大工具,尤其是在样品质地复杂的情况下,但基质匹配的参比材料对于精确的微量分析至关重要。目前唯一可用于锡石氧同位素分析的基质匹配参比材料是 Yongde-Cst,因此需要更多的参比材料。在此,我们报告了 Piaotang-Cst 作为锡石氧同位素显微分析潜在工作参比材料的情况。我们进行的大量 SIMS 显微分析证实,飘塘-Cst 比较均匀,平均两个标准偏差 (2SD) 为 0.49‰(n = 626)。通过传统的氟化同位素比质谱仪测定,飘塘钙钛矿的 δ18OVSMOW 值为 5.33 ± 0.07‰(2SD,n = 5)。我们还证明,锡石氧同位素显微分析不存在由微量元素含量变化引起的可测量的基体效应。我们建议将 Piaotang-Cst 用作工作参比材料,以监测 SIMS 分析的外部重现性和准确性。
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来源期刊
Surface and Interface Analysis
Surface and Interface Analysis 化学-物理化学
CiteScore
3.30
自引率
5.90%
发文量
130
审稿时长
4.4 months
期刊介绍: Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).
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