Intelligent Fault Diagnosis of Manufacturing Processes Using Extra Tree Classification Algorithm and Feature Selection Strategies

IF 5.2 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Sina Yousefi;Shen Yin;Muhammad Gibran Alfarizi
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引用次数: 0

Abstract

Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.
使用 Extra Tree 分类算法和特征选择策略对制造过程进行智能故障诊断
故障诊断是维护实践中不可或缺的一环,可确保最佳的机械功能。传统方法依赖于人类的专业知识,而在机器学习(ML)技术进步的推动下,智能故障诊断技术现在可以自动识别故障。尽管其效率很高,但仍存在研究空白,强调不仅需要可靠的故障识别方法,还需要深入的因果分析方法。本研究介绍了一种使用额外树分类算法和特征选择来识别制造流程中故障重要性的新方法。与 SVM、神经网络和基于树的 ML 相比,该方法提高了训练和计算效率,在预报和健康管理 2021 数据集上实现了超过 99% 的分类准确率。重要的是,该算法使研究人员能够分析单个故障原因,填补了一项关键的研究空白。本研究为进一步研究提供了指导,旨在完善所提出的策略。这项工作有助于推进故障诊断方法,将自动化与全面的因果分析相结合,这对学术和工业应用都至关重要。
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来源期刊
IEEE Open Journal of the Industrial Electronics Society
IEEE Open Journal of the Industrial Electronics Society ENGINEERING, ELECTRICAL & ELECTRONIC-
CiteScore
10.80
自引率
2.40%
发文量
33
审稿时长
12 weeks
期刊介绍: The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments. Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.
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