{"title":"Intelligent Fault Diagnosis of Manufacturing Processes Using Extra Tree Classification Algorithm and Feature Selection Strategies","authors":"Sina Yousefi;Shen Yin;Muhammad Gibran Alfarizi","doi":"10.1109/OJIES.2023.3334429","DOIUrl":null,"url":null,"abstract":"Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.","PeriodicalId":52675,"journal":{"name":"IEEE Open Journal of the Industrial Electronics Society","volume":"4 ","pages":"618-628"},"PeriodicalIF":5.2000,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10323174","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of the Industrial Electronics Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10323174/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Fault diagnosis is integral to maintenance practices, ensuring optimal machinery functionality. While traditional methods relied on human expertise, intelligent fault diagnosis techniques, propelled by machine learning (ML) advancements, now offer automated fault identification. Despite their efficiency, a research gap exists, emphasizing the need for methods providing not just reliable fault identification but also in-depth causal factor analysis. This research introduces a novel approach using an extra tree classification algorithm and feature selection to identify fault importance in manufacturing processes. Compared with SVM, neural networks, and tree-based ML, the method enhances training and computational efficiency, achieving over 99% classification accuracy on prognostics and health management 2021 dataset. Importantly, the algorithm enables researchers to analyze individual fault causes, addressing a critical research gap. The study provides guidelines for further research, aiming to refine the proposed strategy. This work contributes to advancing fault diagnosis methodologies, combining automation with comprehensive causal analysis, crucial for both academic and industrial applications.
期刊介绍:
The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments.
Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.