HAXPES: Inelastic background for characterization of nanostructured materials

IF 16.4 1区 化学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Sven Tougaard
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引用次数: 0

Abstract

Analysis of the spectrum of inelastically scattered electrons in XPS has been used for decades to determine the structure of materials on the nanoscale. Using the higher photon energies available in HAXPES, the method was recently shown to determine structures rather accurately with a more than 100 nm probing depth. In this paper, these HAXPES applications are briefly reviewed. Only two parameters are required for the analysis, namely, the inelastic mean free path and the cross section for inelastic electron scattering. We also discuss in detail how these parameters are best selected.
HAXPES:表征纳米结构材料的非弹性背景
几十年来,XPS中非弹性散射电子的光谱分析一直被用于确定纳米尺度上材料的结构。利用HAXPES中可用的更高光子能量,该方法最近被证明可以相当准确地确定结构,探测深度超过100纳米。本文就HAXPES的应用作一综述。分析只需要两个参数,即非弹性平均自由程和非弹性电子散射截面。我们还详细讨论了如何最好地选择这些参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Accounts of Chemical Research
Accounts of Chemical Research 化学-化学综合
CiteScore
31.40
自引率
1.10%
发文量
312
审稿时长
2 months
期刊介绍: Accounts of Chemical Research presents short, concise and critical articles offering easy-to-read overviews of basic research and applications in all areas of chemistry and biochemistry. These short reviews focus on research from the author’s own laboratory and are designed to teach the reader about a research project. In addition, Accounts of Chemical Research publishes commentaries that give an informed opinion on a current research problem. Special Issues online are devoted to a single topic of unusual activity and significance. Accounts of Chemical Research replaces the traditional article abstract with an article "Conspectus." These entries synopsize the research affording the reader a closer look at the content and significance of an article. Through this provision of a more detailed description of the article contents, the Conspectus enhances the article's discoverability by search engines and the exposure for the research.
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