Hyo Jeong Shin, Paul A. Jewsbury, Peter W. van Rijn
{"title":"Generating group-level scores under response accuracy-time conditional dependence","authors":"Hyo Jeong Shin, Paul A. Jewsbury, Peter W. van Rijn","doi":"10.1186/s40536-022-00122-y","DOIUrl":null,"url":null,"abstract":"<p>The present paper investigates and examines the conditional dependencies between cognitive responses (RA; Response Accuracy) and process data, in particular, response times (RT) in large-scale educational assessments. Using two prominent large-scale assessments, NAEP and PISA, we examined the RA-RT conditional dependencies within each item in the measurement model and the structural model. Evidence for RA-RT conditional dependencies was observed in data from both programs, presenting a challenge in incorporating RT to the current operational models in NAEP and PISA that do not account for RA-RT conditional dependencies. However, inclusion of RT in the model had a relatively large contribution to improving the measurement of ability (residual variance decrease of 11% in NAEP and 18% in PISA), in contrast to relatively modest difference in parameter estimation from neglecting the conditional dependencies (e.g., estimated difference on residual variance of 1% in both NAEP and PISA). We conclude that the benefits of incorporating RT in the operational models for large-scale educational assessments may outweigh the costs.</p>","PeriodicalId":37009,"journal":{"name":"Large-Scale Assessments in Education","volume":"20 10","pages":""},"PeriodicalIF":2.6000,"publicationDate":"2022-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Large-Scale Assessments in Education","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1186/s40536-022-00122-y","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"EDUCATION & EDUCATIONAL RESEARCH","Score":null,"Total":0}
引用次数: 0
Abstract
The present paper investigates and examines the conditional dependencies between cognitive responses (RA; Response Accuracy) and process data, in particular, response times (RT) in large-scale educational assessments. Using two prominent large-scale assessments, NAEP and PISA, we examined the RA-RT conditional dependencies within each item in the measurement model and the structural model. Evidence for RA-RT conditional dependencies was observed in data from both programs, presenting a challenge in incorporating RT to the current operational models in NAEP and PISA that do not account for RA-RT conditional dependencies. However, inclusion of RT in the model had a relatively large contribution to improving the measurement of ability (residual variance decrease of 11% in NAEP and 18% in PISA), in contrast to relatively modest difference in parameter estimation from neglecting the conditional dependencies (e.g., estimated difference on residual variance of 1% in both NAEP and PISA). We conclude that the benefits of incorporating RT in the operational models for large-scale educational assessments may outweigh the costs.