Express Method for Impedance Spectroscopy of Small Solid-State Samples at Frequencies of 20 kHz–1 GHz

IF 0.4 4区 工程技术 Q4 ENGINEERING, MULTIDISCIPLINARY
V. A. Milyushenko, B. Pinter, S. B. Bibikov
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Abstract

A simple and effective technique for express diagnostics of materials, which allows for the most efficient preparation of samples, the actual measurements, and obtaining data on material parameters, in particular, on the dispersion of the permittivity, is proposed. An express method for impedance spectroscopy of small samples at frequencies from 20 kHz to 1 GHz has been developed on the basis of a vector network analyzer using a conical coaxial measuring cell and adapters for connecting two-pole objects to the coaxial input of the device. The measuring cell is designed for disk samples with a diameter of up to 6 mm with a maximum volume of up to 0.1 cm3 as well as for samples in the form of rectangular plates that can be inscribed in a circle of the same diameter. Adapters also make it possible to connect two-terminal networks in the form of concentrated hinged or surface-mounted elements. In contrast to measurements in a coaxial path, the proposed technique does not require an accurate connecting transverse dimension, which allows for prompt sample preparation. The issues of determining the frequency range in which the measurement error does not exceed the allowable value are considered. A method is proposed for increasing the upper limit of the operating frequency of the measuring cell with the test sample using additional calibration. The developed program for controlling the processes of standard and additional calibration and the process of measurements in a certain frequency range, at which the measurement error does not exceed the permissible value, makes it possible to obtain the values of resistance, capacitance, inductance, and other electrical characteristics of the measuring cell with the sample under study within a few seconds.

Abstract Image

在 20 kHz-1 GHz 频率范围内对小型固态样品进行阻抗光谱分析的快速方法
本文提出了一种简单而有效的材料快速诊断技术,可以最有效地制备样品、进行实际测量并获得材料参数数据,特别是介电常数的分散数据。在矢量网络分析仪的基础上,利用锥形同轴测量池和用于将两极物体连接到设备同轴输入端的适配器,开发了一种在 20 kHz 至 1 GHz 频率范围内对小型样品进行阻抗光谱分析的快速方法。测量单元适用于直径最大为 6 毫米、最大体积为 0.1 立方厘米的圆盘样品,以及可嵌入相同直径圆圈的矩形板样品。适配器还可以连接集中铰链或表面安装元件形式的双终端网络。与同轴路径的测量相比,所建议的技术不需要精确的连接横向尺寸,因此可以快速制备样品。考虑了确定测量误差不超过允许值的频率范围的问题。还提出了一种方法,利用额外的校准来提高测量单元与测试样品的工作频率上限。所开发的程序用于控制标准校准和附加校准过程,以及在一定频率范围内的测量过程(在该频率范围内测量误差不超过允许值),因此可以在几秒钟内获得带有被测样品的测量池的电阻、电容、电感和其他电气特性值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Instruments and Experimental Techniques
Instruments and Experimental Techniques 工程技术-工程:综合
CiteScore
1.20
自引率
33.30%
发文量
113
审稿时长
4-8 weeks
期刊介绍: Instruments and Experimental Techniques is an international peer reviewed journal that publishes reviews describing advanced methods for physical measurements and techniques and original articles that present techniques for physical measurements, principles of operation, design, methods of application, and analysis of the operation of physical instruments used in all fields of experimental physics and when conducting measurements using physical methods and instruments in astronomy, natural sciences, chemistry, biology, medicine, and ecology.
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