Electrons Vs. Photons: Assessment of Circuit’s Activity Requirements for E-Beam and Optical Probing Attacks

Elham Amini, Tuba Kiyan, Lars Renkes, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert, Jörg Jatzkowski, Frank Altmann, Sebastian Brand, Shahin Tajik
{"title":"Electrons Vs. Photons: Assessment of Circuit’s Activity Requirements for E-Beam and Optical Probing Attacks","authors":"Elham Amini, Tuba Kiyan, Lars Renkes, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert, Jörg Jatzkowski, Frank Altmann, Sebastian Brand, Shahin Tajik","doi":"10.31399/asm.cp.istfa2023p0339","DOIUrl":null,"url":null,"abstract":"Abstract Contactless probing methods through the chip backside have been demonstrated to be powerful attack techniques in the field of electronic security. However, these attacks typically require the adversary to run the circuit under specific conditions, such as enforcing the switching of gates or registers with certain frequencies or repeating measurements over multiple executions to achieve an acceptable signal-to-noise ratio (SNR). Fulfilling such requirements may not always be feasible due to challenges such as low-frequency switching or inaccessibility of the control signals. In this work, we assess these requirements for contactless electron- and photon-based probing attacks by performing extensive experiments. Our findings demonstrate that E-beam probing, in particular, has the potential to outperform optical methods in scenarios involving static or low-frequency circuit activities.","PeriodicalId":20443,"journal":{"name":"Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2023p0339","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Abstract Contactless probing methods through the chip backside have been demonstrated to be powerful attack techniques in the field of electronic security. However, these attacks typically require the adversary to run the circuit under specific conditions, such as enforcing the switching of gates or registers with certain frequencies or repeating measurements over multiple executions to achieve an acceptable signal-to-noise ratio (SNR). Fulfilling such requirements may not always be feasible due to challenges such as low-frequency switching or inaccessibility of the control signals. In this work, we assess these requirements for contactless electron- and photon-based probing attacks by performing extensive experiments. Our findings demonstrate that E-beam probing, in particular, has the potential to outperform optical methods in scenarios involving static or low-frequency circuit activities.
电子与光子:电子束和光学探测攻击的电路活动性要求评估
通过芯片背面的非接触式探测方法已被证明是电子安全领域中一种强有力的攻击技术。然而,这些攻击通常要求攻击者在特定条件下运行电路,例如强制以特定频率切换门或寄存器,或在多次执行中重复测量以达到可接受的信噪比(SNR)。由于低频开关或控制信号不可接近等挑战,满足这些要求可能并不总是可行的。在这项工作中,我们通过进行广泛的实验来评估非接触式电子和光子探测攻击的这些要求。我们的研究结果表明,特别是电子束探测,在涉及静态或低频电路活动的情况下,具有超越光学方法的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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