ICCDLAB : Silicon Chip Tooling for Failure Analysis Laboratories

Nicolas Lysee, Thierry Parrassin, Céline Le Gloanec, Bertrand Borot, Sylvain Dudit
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引用次数: 0

Abstract

Abstract The ICCDLAB (Integrated Circuit for Characterization and Debug Laboratory) test chip is a full custom silicon chip dedicated to failure analysis. This chip embeds several custom devices designed to highlight, reproduce, and simulate defects, as well as enhance the signatures obtained through failure analysis techniques that are used to locate defects in circuits. The ICCDLAB serves as a versatile tool for failure analysts, providing a “Swiss army knife” and a failure analysts’ playground at the same time. The chip offers a simple means of covering an exhaustive catalog of failure analysis techniques and approaches, allowing for equipment benchmarking, training of individuals new to the failure analysis field, understanding of failure mechanisms and signatures, simulation of defect behaviors, and support for development of new techniques.
用于故障分析实验室的硅芯片工具
ICCDLAB (Integrated Circuit for Characterization and Debug Laboratory)测试芯片是一款专门用于故障分析的全定制硅芯片。该芯片嵌入了几个定制的设备,用于突出、再现和模拟缺陷,以及增强通过故障分析技术获得的特征,这些技术用于定位电路中的缺陷。ICCDLAB是故障分析人员的多功能工具,同时提供了“瑞士军刀”和故障分析人员的游乐场。该芯片提供了一种简单的方法,涵盖了故障分析技术和方法的详尽目录,允许设备基准测试,培训新进入故障分析领域的个人,了解故障机制和特征,模拟缺陷行为,并支持新技术的开发。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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